Summary
International Symposium on Electromagnetic Compatibility
2009
Session Number:22Q3
Session:
Number:22Q3-6
A Technology for Evaluating LSI Radiated Immunity Using Stripline Method
Y. Akiyama, E. Iwasaki, T. Horie, J. Shirai,
pp.433-436
Publication Date:2009/7/20
Online ISSN:2188-5079
Summary:
The technology for evaluating LSI radiated immunity was developed using our original stripline cell(SL-Cell) as an alternative to the conventional TEM-Cell. This enabled us to carry out LSI radiated immunity tests at up to 7400 V/m with low power consumption (10 W). The developed system for testing the LSI radiated immunity can share its main body with the LSI conducted immunity test system using DPI method.