Summary
International Symposium on Nonlinear Theory and Its Applications
2015
Session Number:B4L-F
Session:
Number:B4L-F-4
Investigation of Ion Current Behavior on Charged Samples Using Scanning Ion Conductance Microscopy
Futoshi Iwata, Kimihiro Ishizaki, Masato Nakajima, Tatsuo Ushiki,
pp.748-751
Publication Date:2015/12/1
Online ISSN:2188-5079
Summary:
The scanning ion conductance microscope (SICM), a member of the family of scanning probe microscopes, can be used to study nano and micrometer scale biological samples. SICM images samples by detecting ion current flowing through a pipette aperture. However, the electrical charge of the sample surface influences the ion current detected by SICM. In this research, to investigate the influence of the charged sample on SICM imaging, the behaviors of the ion current on charged surfaces were studied. For the approach curve, current behavior as the nanopipette approaches the surfaces, the detail properties including non-linearity and its influence on imaging were investigated. Imaging of Indian muntjac that is spontaneously charged negatively in buffer solution was performed. When positive potential was applied to the pipette electrode, the topography of chromosome was successfully obtained. On the other hand, when negative potential was applied to the pipette electrode, it was difficult to obtain the topography of the chromosome.