Summary
International Technical Conference on Circuits/Systems, Computers and Communications
2008
Session Number:P2
Session:
Number:P2-31
Current Testable Design of Resistor String DACs for Open Defects
Yutaka Hata, Masaki Hashizume, Hiroyuku Yotsuyanagi, Yukiya Miura,
pp.-
Publication Date:2008/7/7
Online ISSN:2188-5079
Summary:
A DFT method of resistor string digital-to-analog converters (DACs) is proposed so as to be tested fully by supply current testing. Targeted defects are opens in the DACs. Testability of opens in testable designed DACs is examined experimentally. The results show that all of the opens in an N-bits testable designed DAC will be detected with test vectors of about 2(N-1) by supply current testing.