Summary

2016 International Symposium on Antennas and Propagation

2016

Session Number:POS2

Session:

Number:POS2-113

Reduction of Edge Diffraction Effect of MUT Holder Using EM Absorber in W-band Free-space Material Measurements

Jin-Seob Kang,  Jeong-Hwan Kim,  Jeong-Il Park,  

pp.936-937

Publication Date:2016/10/24

Online ISSN:2188-5079

DOI:10.34385/proc.38.POS2-113

PDF download (1.7MB)

Summary:
In free-space material measurements, it is known that the transverse dimension of a planar MUT (Material Under Test) should be larger than three times the beam waist of the antenna to neglect diffraction effect at the edges of the MUT. To hold the MUT, MU