Electronics-Integrated Circuits and Devices(Date:2007/01/11)

Presentation
SoC macro-block diagnosis using extracted layout information

Katsuyoshi MIURA,  Koji NAKAMAE,  

[Date]2007/1/11
[Paper #]CPM2006-147,ICD2006-189
A Constrained Test Generation Method for Low Power Testing

Yoshiaki TOUNOUE,  Xiaoqing WEN,  Seiji KAJIHARA,  Kohei MIYASE,  Tatsuya SUZUKI,  Yuta YAMATO,  

[Date]2007/1/11
[Paper #]CPM2006-148,ICD2006-190
A Note on 100x Test Data Compression for Scan-Based BIST

Masayuki ARAI,  Satoshi FUKUMOTO,  Kazuhiko IWASAKI,  Tatsuru MATSUO,  Takahisa HIRAIDE,  Hideaki KONISHI,  Michiaki EMORI,  Takashi AIKYO,  

[Date]2007/1/11
[Paper #]CPM2006-149,ICD2006-191
Estimation methods of faulty parameters for analog circuits

Norio KUJI,  

[Date]2007/1/11
[Paper #]CPM2006-150,ICD2006-192
Integrated RF-MEMS and Its Packaging Technology

Kei Kuwabara,  Norio Sato,  Katsuyuki Machida,  Hiromu Ishii,  Munenari Kawashima,  Yo Yamaguchi,  Kazuhiro Uehara,  

[Date]2007/1/11
[Paper #]CPM2006-151,ICD2006-193
Effects of the Board Power/Ground Layer Configuration on Simultaneous Switching Noise (SSN) and EMI

Takanobu KUSHIHIRA,  Toshio SUDO,  

[Date]2007/1/11
[Paper #]CPM2006-152,ICD2006-194
Wideband Decoupling Properties by the Combination of Ultra-thin Insulator and EBG Structure

Seiju ICHJO,  Takanobu KUSHIHIRA,  Toshio SUDO,  

[Date]2007/1/11
[Paper #]CPM2006-153,ICD2006-195
EMI Reducing Techniques for Low Voltage Differential Signaling by applying a Vertically Differential Method and Data Arrangement Optimization

Ayako TAKAGI,  Masahiro BABA,  Haruhiko OKUMURA,  

[Date]2007/1/11
[Paper #]CPM2006-154,ICD2006-196
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