Presentation 2007-01-19
SoC macro-block diagnosis using extracted layout information
Katsuyoshi MIURA, Koji NAKAMAE,
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Abstract(in English) A SoC macro-block diagnostic method using a netlist extracted from layout data is proposed. A hard IP core that does not have the pre-designed netlist is diagnosed by using a netlist extracted from the layout. A prober is used after the device is diagnosed by using output patterns (fail log). A netlist is extracted only from the upstream logic cone area of the faulty output terminals. Therefore the size of circuit under diagnosis is reduced. Our method uses the test pattern for diagnosis and modifies the score of the diagnostic result by considering resistance and parasitic capacitance extracted from the layout in order to improve diagnostic resolution and reduce the number of the probing operations. We applied our method to the layout synthesized from the ISCAS'85 benchmark circuits in order to show its validity.
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Keyword(in English) VLSI / fault diagnosis / circuit extraction / prober / test pattern
Paper # CPM2006-147,ICD2006-189
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Conference Date 2007/1/11(1days)
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Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) SoC macro-block diagnosis using extracted layout information
Sub Title (in English)
Keyword(1) VLSI
Keyword(2) fault diagnosis
Keyword(3) circuit extraction
Keyword(4) prober
Keyword(5) test pattern
1st Author's Name Katsuyoshi MIURA
1st Author's Affiliation Dept. Information Systems Eng., Grad. Sch. Information Science and Technology, Osaka University()
2nd Author's Name Koji NAKAMAE
2nd Author's Affiliation Dept. Information Systems Eng., Grad. Sch. Information Science and Technology, Osaka University
Date 2007-01-19
Paper # CPM2006-147,ICD2006-189
Volume (vol) vol.106
Number (no) 468
Page pp.pp.-
#Pages 6
Date of Issue