Presentation 2007-01-19
Estimation methods of faulty parameters for analog circuits
Norio KUJI,
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Abstract(in English) As cellar phones and wireless LANs are popularly used in our lives, mixed-signal LSIs, which have analog circuits for radio-frequency signal processing insides, increased in number, and their fault diagnosis is becoming more and more essential. Previously, we proposed an improved parameter-estimation method for diagnosing parametric faults of analog circuits, and demonstrated that the proposed method makes it possible to diagnose them without any design knowledge. To implement such methods into a diagnostic system, it is necessary to establish efficient algorithms for acquiring parameter solutions to circuit equations. In this paper, we propose algorithms of demonstrating existence of solutions to circuit equations and finding all their solutions. Existence of solutions is shown by excluding non-solution regions in successive binary division, and Newton method and genetic algorithm are introduced to find all the solutions of equations. As a result of evaluating these introduced methods, it was demonstrated to acquire solutions stably and efficiently.
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Keyword(in English) Parametric faults / Analog circuits / Via resistance / Finding solutions / Fault diagnosis
Paper # CPM2006-150,ICD2006-192
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Conference Date 2007/1/11(1days)
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Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Estimation methods of faulty parameters for analog circuits
Sub Title (in English)
Keyword(1) Parametric faults
Keyword(2) Analog circuits
Keyword(3) Via resistance
Keyword(4) Finding solutions
Keyword(5) Fault diagnosis
1st Author's Name Norio KUJI
1st Author's Affiliation Hachinohe National College of Technology()
Date 2007-01-19
Paper # CPM2006-150,ICD2006-192
Volume (vol) vol.106
Number (no) 468
Page pp.pp.-
#Pages 6
Date of Issue