Information and Systems-Dependable Computing(Date:2015/06/16)

Presentation
A test data reduction method based on scan slice on BAST

Makoto Nishikiori(Nihon Univ.),  Hiroshi Yamazaki(Nihon Univ.),  Toshinori Hosokawa(Nihon Univ.),  Masayuki Arai(Nihon Univ.),  Masayoshi Yoshimura(Kyoto Sangyo Univ.),  

[Date]2015-06-16
[Paper #]DC2015-16
A Method to Identify High Test Power Areas in Layout Design

Kohei Miyase(Kyutech),  Matthias Sauer(Univ. Freiburg),  Bernd Becker(Univ. Freiburg),  Xiaoqing Wen(Kyutech),  Seiji Kajihara(Kyutech),  

[Date]2015-06-16
[Paper #]DC2015-18
Performance Evaluation of Dependability Improvement Methods for Multiple Core Systems based on Markov Models

Masashi Imai(Hirosaki Univ.),  Tomohiro Yoneda(NII),  

[Date]2015-06-16
[Paper #]DC2015-20
Study on Fast Bridge Fault Test Generation Based on Critical Area

Masayuki Arai(Nihon Univ.),  Shingo Inuyama(Tokyo Metro. Univ.),  Kazuhiko Iwasaki(Tokyo Metro. Univ.),  

[Date]2015-06-16
[Paper #]DC2015-17
Using binary decision diagrams for constraint handling in test case generation

Tatsuhiro Tsuchiya(Osaka Univ.),  

[Date]2015-06-16
[Paper #]DC2015-21
A Study on Function Test of Latch-based Asynchronous Pipeline Circuits

Daiki Toyoshima(Hirosaki Univ.),  Kyohei Terayama(Hirosaki Univ.),  Atsushi Kurokawa(Hirosaki Univ.),  Masashi Imai(Hirosaki Univ.),  

[Date]2015-06-16
[Paper #]DC2015-19