Electronics-Silicon Devices and Materials(Date:2002/11/22)

Presentation
表紙

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[Date]2002/11/22
[Paper #]
目次

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[Date]2002/11/22
[Paper #]
Ion implantation database based on a tail function

Kunihiro SUZUKI,  

[Date]2002/11/22
[Paper #]SDM2002-205
Evaluation of carrier profiles in the extension region of sub-100nm MOSFETs

Hidenobu FUKUTOME,  Takayuki AOYAMA,  Hiroshi ARIMOTO,  

[Date]2002/11/22
[Paper #]SDM2002-206
Influence of Finite Inversion Layer Thickness on Variable Threshold Voltage CMOS (VTCMOS)

Toshiharu NAGUMO,  Toshiro HIRAMOTO,  

[Date]2002/11/22
[Paper #]SDM2002-207
Optimum Device Consideration for Standby Power Reduction Scheme Using Drain Induced Barrier Lowering (DIBL)

Qingyan LIU,  Takayasu SAKURAI,  Toshiro HIRAMOTO,  

[Date]2002/11/22
[Paper #]SDM2002-208
Diagnostics of History Effects in Partially-Depleted SOI CMOS : Pseudo-Fully-Depleted Operation

Michiru HOGYOKU,  

[Date]2002/11/22
[Paper #]SDM2002-209
Low-temperature DRAM process for high performance system LSI with high-density embedded memory

E. Yoshida,  T. Miyashita,  H. Nitta,  M. Tanaka,  K. Ishii,  Y. Akasaka,  P.H. chou,  K. Hashimoto,  Y. kohyama,  T. Tanaka,  Y. Nara,  

[Date]2002/11/22
[Paper #]SDM2002-210
[OTHERS]

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[Date]2002/11/22
[Paper #]