Electronics-Silicon Devices and Materials(Date:2002/09/23)

Presentation
表紙

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[Date]2002/9/23
[Paper #]
目次

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[Date]2002/9/23
[Paper #]
Realistic Scaling Scenario for Sub-lOOnm Embedded SRAM Based on 3-Dimensional Interconnect Simulation

Yasumasa TSUKAMOTO,  Tatsuya KUNIKIYO,  Koji NII,  Hiroshi MAKINO,  Shuhei IWADE,  Kiyoshi ISHIKAWA,  Yasuo INOUE,  

[Date]2002/9/23
[Paper #]SDM2002-169
Analysis of The Reverse Narrow Channel Effect of Submicron MOSFETs : The Effects of The High-K Gate Dielectrics

Shoji WAKAHARA,  Yasuyuki OHKURA,  Hirotaka AMAKAWA,  Kenji NISHI,  

[Date]2002/9/23
[Paper #]SDM2002-170
Optimization of Lateral Diffusion of Source and Drain for Sub-100-nm Channel Silicon-on-insulator MOSFETs

Akihiro KAWAMOTO,  Shingo SATO,  Yasuhisa OMURA,  

[Date]2002/9/23
[Paper #]SDM2002-171
TCAD Driven Process Design of Fully-Depleted SOI Transistor

Noriyuki MIURA,  Hirotaka KOMATSUBARA,  Marie MOCHIZUKI,  Hirokazu HAYASHI,  Koichi FUKUDA,  

[Date]2002/9/23
[Paper #]SDM2002-172
Statistical Analyses of the Influence of Grain Boundary Variations in Poly-Si TFTs

Yoshiyuki KITAHARA,  Shigeyuki TAKAGI,  Shuichi TORIYAMA,  Nobuyuki SANO,  

[Date]2002/9/23
[Paper #]SDM2002-173
Carrier scattering effect in a quasi-Ballistic MOSFET

Naoya WADA,  Kenji NATORI,  

[Date]2002/9/23
[Paper #]SDM2002-174
Simulation of inversion layer mobility roll-off by using molecular dynamics/Ensemble Monte Carlo (MD/EMC) method

Hironori RYOUKE,  Yoshinari KAMAKURA,  Kenji TANIGUCHI,  

[Date]2002/9/23
[Paper #]SDM2002-175
Quantum Mechanical Corrections in Monte Carlo Device Simulation

Hideaki TSUCHIYA,  Tanroku MIYOSHI,  

[Date]2002/9/23
[Paper #]SDM2002-176
Effect of field-induced coherence on transport in semiconductors : Waepacket basis for quantum transport

Masato MORIFUJI,  Katsuhiko KATO,  

[Date]2002/9/23
[Paper #]SDM2002-177
Simulation of Electronic Wave Propagation in Devices Using Quantum Lattice-Gas Model

Atsushi SAKAI,  Yoshinari KAMAKURA,  Kenji TANIGUCHI,  

[Date]2002/9/23
[Paper #]SDM2002-178
[OTHERS]

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[Date]2002/9/23
[Paper #]