Electronics-Electron Devices(Date:2023/05/19)

Presentation
Effect of adding surfactants and high boiling solvents to PEDOT:PSS organic thermoelectric thin films

Naoki Kishi(Nagoya Inst. of Tech.),  Keisuke Ono(Nagoya Inst. of Tech.),  Satoshi Hibi(Nagoya Inst. of Tech.),  

[Date]2023-05-19
[Paper #]
Effect of Ge Epitaxial Buffer Layer on Solid Phase Growth of Ge on Si

Satoki Furuya(Toyohashi Univ. Tech.),  Mikiya Kuzutani(Toyohashi Univ. Tech.),  Jose A. Piedra-Lorenzana(Toyohashi Univ. Tech.),  Takeshi Hizawa(Toyohashi Univ. Tech.),  Keisuke Yamane(Toyohashi Univ. Tech.),  Yasuhiko Ishikawa(Toyohashi Univ. Tech.),  

[Date]2023-05-19
[Paper #]ED2023-6,CPM2023-6,SDM2023-23
AlN film by reactive sputtering as a stressor for Ge photonic devices on Si

Jose A. Piedra-Lorenzana(Toyohashi Univ. Tec.),  Shohei Kaneko(Toyohashi Univ. Tec.),  Takaaki Fukushima(Toyohashi Univ. Tec.),  Keisuke Yamane(Toyohashi Univ. Tec.),  Junichi Fujikata(Tokushima Univ.),  Yasuhiko Ishikawa(Toyohashi Univ. Tec.),  

[Date]2023-05-19
[Paper #]ED2023-9,CPM2023-9,SDM2023-26
Low-damage photo-electrochemical etching and electrochemical characterization of p-GaN layers grown on n-GaN substrates

Umi Takatsu(Hokkaido Univ.),  Kouta Kubo(Hokkaido Univ.),  Taketomo Sato(Hokkaido Univ.),  

[Date]2023-05-19
[Paper #]ED2023-7,CPM2023-7,SDM2023-24
Relationship between motion constraints and walking behavior in a four-legged autonomous robot with an amoeba-inspired optimization mechanism

Kazuki Matsuda(Hokkaido Univ.),  Seiya Kasai(Hokkaido Univ.),  

[Date]2023-05-19
[Paper #]ED2023-4,CPM2023-4,SDM2023-21
Fabrication and evaluation of transfer-free graphene FETs on sapphire substrates using agglomeration phenomenon of Ni patterns with ultra-fine structure

Ichiro Kato(Nagoya Inst. of Tech.),  Toshiharu Kubo(Nagoya Inst. of Tech.),  Makoto Miyoshi(Nagoya Inst. of Tech.),  Takashi Egawa(Nagoya Inst. of Tech.),  

[Date]2023-05-19
[Paper #]ED2023-5,CPM2023-5,SDM2023-22
Flexible Thermoelectric Materials with ZnO Nanorods for Self-powered Physiological Sensors

Hiroya Ikeda(Shizuoka Univ.),  Naoki Fujiwara(Shizuoka Univ.),  Koki Kato(Shizuoka Univ.),  Masaru Shimomura(Shizuoka Univ.),  Yasuhiro Hayakawa(Shizuoka Univ.),  Toshitaka Yamakawa(NAIST),  Kazushi Ikeda(NAIST),  

[Date]2023-05-19
[Paper #]ED2023-2,CPM2023-2,SDM2023-19
Micro Periodic Structures (LIPSS) Formed on Si Substrates Using Near-Infrared Free Electron Laser Irradiation

Youta Hoshino(Nihon Univ.),  Nohira Masayoshi(Nihon Univ.),  Nobuyuki Iwata(Nihon Univ.),  

[Date]2023-05-19
[Paper #]ED2023-3,CPM2023-3,SDM2023-20
Study of device isolation technology of AlGaN/GaN high-electron-mobility transistors for their integration

Tatsuya Akamatsu(TUT),  Yoshiki Akira(TUT),  Hiroshi Okada(TUT),  

[Date]2023-05-19
[Paper #]ED2023-8,CPM2023-8,SDM2023-25
[Invited Talk] Repeated bending endurance test of zinc oxide thin films deposited at room temperature on flexible substrates

Toshihiko Maemoto(Osaka Inst. of Tech.),  Kazuyori Oura(Osaka Inst. of Tech.),  Hideo Wada(Osaka Inst. of Tech.),  Masatoshi Koyama(Osaka Inst. of Tech.),  Shigehiko Sasa(Osaka Inst. of Tech.),  Ahikiko Fujii(Osaka Inst. of Tech.),  

[Date]2023-05-19
[Paper #]ED2023-1,CPM2023-1,SDM2023-18