IEICE Technical Report

Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380

Reliability

Workshop Date : 2014-11-20 / Issue Date : 2014-11-13

R2014-61
Prediction of performance degradation and lifetime for semiconductor devices using markov chain model
Kai Momoda, Koichi Endo, Yoshihiro Midoh, Katsuyoshi Miura, Koji Nakamae (Osaka Univ.)
pp. 1 - 5

R2014-62
The study about acceleration model of ceramic capacitors by voltage stress
Toshinari Matsuoka (MELCO)
pp. 7 - 14

R2014-63
Problem of Repeatability about Dew Test and Evaluation Method by Micro Dew Condensation Test
Mayuko Nishihara, Kazuhiro Hayashinuma (Murata.Co)
pp. 15 - 19

R2014-64
A Study on Evaluation for fretting corrosion
Sadanori Itou (itoken office)
pp. 21 - 24

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan