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各ワーキンググループの状況
ワーキンググループ13

タイトル:
  Design Automation: Component, Circuit and System Description languages


     コンビナー

Mr. Genichi TANAKA (JP)
Mr. Dennis BROPHY (US)

     タスク内容

 To maintain the following series standards to continuously improve design productivity and design quality as a part of solutions :
- IEC 61691 series,
- IEC 62530 and IEC 62531: design and verification languages
- IEC 61523 series: delay and power format
- IEC 62014 series: component characteristics format
- IEC 63055 series: multiple level design interoperable language
To newly develop language, format and technical report to realize design for energy saving, design for higher reusability and interoperability among heterogeneous environments.

INDEX

ワーキンググループ14
タイトル:
  Design Automation: Library of Reusable Parts for Electrotechnical Products


     コンビナー

Mr. Mitsuru TAKAHASHI

     タスク内容

 To develop standards in the field of reusable parts library for electrotechnical products, to facilitate the interoperability of the semantics of actual parts information, and to prepare circulation methods and exchange rules for electro-technical products.
This includes defining methods for product data exchange, and defining architecture of commercially available parts library to facilitate design, engineering, manufacturing, procurement and logistic support.


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ワーキンググループ15
タイトル:
  Design Automation: Testing of Electrotechnical Products


     コンビナー

Dr. Osamu KARATSU
Mr. Narayanan RAMACHANDRAN

     タスク内容

 To maintain the following series to continuously improve testing productivity and quality as a part of solutions :
- IEC 61445 series: DTIF
- IEC 61671 series: ATML
- IEC 61926 series: ATLAS
- IEC 62243 series: AI-ESTATE
- IEC 62525, 62526, 62527: STIL
- IEC 62528: Testability Embedded Core
- IEC 62529: STD
- IEC 61636 series: SIMICA
- IEC 63003, 63004: Receiver Fixture Interface
To newly develop testing protocols and technical reports to realize testing for energy saving, high to low level sophistication and interoperability among heterogeneous testing environments.

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