| Presentation | 2013-06-21 Degradation Phenomenon of Electrical Contacts by using a Hammering Oscillating Mechanism or a Micro-Sliding Mechanism : A fundamental study on the performance of the hammering oscillating mechanism (27) Shin-ichi WADA, Keiji KOSHIDA, Naoki MASUDA, Kunio YANAGI, Hiroaki KUBOTA, Koichiro SAWA, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Authors have studied the influence on electrical contacts by actual micro-oscillation using some oscillating mechanisms (Hammering Oscillating Mechanism, Micro-Sliding Mechanism, Tapping Device etc.). In addition, they have proposed a simple and practical protocol to estimate the fundamental dynamical parameter such as an "effective mass", an "effective force" and an "effective acceleration" of the electrical devices on the PCB (printed circuit board), which are comparatively lightweight, using hammering oscillating mechanism. In this paper, they introduce an "additional mass parameter" in addition to the above dynamical parameters. They consider the influence of an additional mass which is indispensable for the protocol and the validation of the dynamical parameters. And they compare the data of an "effective acceleration" of the protocol with the data calculated by a capacitance displacement sensor by using Hammering Oscillating Mechanism (HOM) |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | electrical contact / micro-oscillation / contact resistance / hammering oscillating mechanism / effective mass / effective force / effective acceleration |
| Paper # | EMD2013-17,CPM2013-32,OME2013-40 |
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| Conference Information | |
| Committee | EMD |
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| Conference Date | 2013/6/14(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Electromechanical Devices (EMD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Degradation Phenomenon of Electrical Contacts by using a Hammering Oscillating Mechanism or a Micro-Sliding Mechanism : A fundamental study on the performance of the hammering oscillating mechanism (27) |
| Sub Title (in English) | |
| Keyword(1) | electrical contact |
| Keyword(2) | micro-oscillation |
| Keyword(3) | contact resistance |
| Keyword(4) | hammering oscillating mechanism |
| Keyword(5) | effective mass |
| Keyword(6) | effective force |
| Keyword(7) | effective acceleration |
| 1st Author's Name | Shin-ichi WADA |
| 1st Author's Affiliation | TMC System Co. Ltd.() |
| 2nd Author's Name | Keiji KOSHIDA |
| 2nd Author's Affiliation | TMC System Co. Ltd. |
| 3rd Author's Name | Naoki MASUDA |
| 3rd Author's Affiliation | TMC System Co. Ltd. |
| 4th Author's Name | Kunio YANAGI |
| 4th Author's Affiliation | TMC System Co. Ltd. |
| 5th Author's Name | Hiroaki KUBOTA |
| 5th Author's Affiliation | TMC System Co. Ltd. |
| 6th Author's Name | Koichiro SAWA |
| 6th Author's Affiliation | Nippon Institute of Thechnology |
| Date | 2013-06-21 |
| Paper # | EMD2013-17,CPM2013-32,OME2013-40 |
| Volume (vol) | vol.113 |
| Number (no) | 96 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |