IEICE Technical Committee Submission System
Download Link
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

PDF Download Link
Presentation 2013-06-21 14:40
Degradation Phenomenon of Electrical Contacts by using a Hammering Oscillating Mechanism or a Micro-Sliding Mechanism -- A fundamental study on the performance of the hammering oscillating mechanism (27) --
Shin-ichi Wada, Keiji Koshida, Naoki Masuda, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT)
PDF Download Link EMD2013-17 CPM2013-32 OME2013-40 Link to ES Tech. Rep. Archives: EMD2013-17 CPM2013-32 OME2013-40
Copyright and reproduction All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan