Presentation 2013-01-16
Break Even Time Evaluation of Run-Time Power Gating Control by On-chip Leakage Monitor
Kensaku MATSUNAGA, Hideharu AMANO, Masaru KUDO, Ryuichi SAKAMOTO, Yuya OHTA, Mitaro NAMIKI, Nao KONISHI, Kimiyoshi USAMI,
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Abstract(in English) Run-time Power Gating (RTPG) reduces leakage energy by turning off a power switch(PS) for idle periods of a circuit during the operation. To get energy savings in RTPG, power gating needs to be enabled only when the idle time exceeds the break-even time (BET) at which leakage energy reduction by turning off PS becomes equal to the energy overhead. Since BET changes with leakage current.on-line detection of BET is required for RTPG controls. We implemented an on-chip leakage monitor m 65nm CMOS technology, and showed the relation between BET of each computing unit, and leakage current.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) On-chip Leakagemonitor / Run time Power Gating / Break Even Time (BET)
Paper # VLD2012-118,CPSY2012-67,RECONF2012-72
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Committee RECONF
Conference Date 2013/1/9(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Break Even Time Evaluation of Run-Time Power Gating Control by On-chip Leakage Monitor
Sub Title (in English)
Keyword(1) On-chip Leakagemonitor
Keyword(2) Run time Power Gating
Keyword(3) Break Even Time (BET)
1st Author's Name Kensaku MATSUNAGA
1st Author's Affiliation Shibaura Institute of Technology()
2nd Author's Name Hideharu AMANO
2nd Author's Affiliation Faculty of science and Technology, Keio University
3rd Author's Name Masaru KUDO
3rd Author's Affiliation Shibaura Institute of Technology
4th Author's Name Ryuichi SAKAMOTO
4th Author's Affiliation Tokyo Univ of Agriculture and Technology
5th Author's Name Yuya OHTA
5th Author's Affiliation Shibaura Institute of Technology
6th Author's Name Mitaro NAMIKI
6th Author's Affiliation Tokyo Univ of Agriculture and Technology
7th Author's Name Nao KONISHI
7th Author's Affiliation Shibaura Institute of Technology
8th Author's Name Kimiyoshi USAMI
8th Author's Affiliation Shibaura Institute of Technology
Date 2013-01-16
Paper # VLD2012-118,CPSY2012-67,RECONF2012-72
Volume (vol) vol.112
Number (no) 377
Page pp.pp.-
#Pages 6
Date of Issue