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| Presentation | 2013-01-16 16:00 Break Even Time Evaluation of Run-Time Power Gating Control by On-chip Leakage Monitor Kensaku Matsunaga, Masaru Kudo (SIT), Yuya Ohta, Nao Konishi (SIT), Hideharu Amano (KU), Ryuichi Sakamoto, Mitaro Namiki (TUAT), Kimiyoshi Usami (SIT) |
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| PDF Download Link |  VLD2012-118 CPSY2012-67 RECONF2012-72 |
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