Presentation | 2012-08-02 Intra/Inter Tier Substrate Noise Measurements in 3D ICs Yasumasa TAKAGI, Yuuki ARAGA, Makoto NAGATA, DER PLAS Geert VAN, Jaemin KIM, Nikolaos MINAS, Pol MARCHAL, Michael LIBOIS, MANNA Antonio LA, Wenqi ZHANG, Julien RYCKAERT, Eric BEYNE, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Substrate noise propagation among stacked dice is evaluated in a 3D test vehicle of 2 tier stacking. Each tier incorporates on-chip monitoring circuits and digital noise source circuits. Silicon measurements show that the substrate noise is attenuated in the propagation between tiers with through silicon vias (TSVs). The effect of p+ guard bands in the stack is also evaluated. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | 3D-LSI / TSV / On-chip testing |
Paper # | SDM2012-72,ICD2012-40 |
Date of Issue |
Conference Information | |
Committee | ICD |
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Conference Date | 2012/7/26(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
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Chair | |
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Paper Information | |
Registration To | Integrated Circuits and Devices (ICD) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Intra/Inter Tier Substrate Noise Measurements in 3D ICs |
Sub Title (in English) | |
Keyword(1) | 3D-LSI |
Keyword(2) | TSV |
Keyword(3) | On-chip testing |
1st Author's Name | Yasumasa TAKAGI |
1st Author's Affiliation | Graduate school of system informatics, Kobe University() |
2nd Author's Name | Yuuki ARAGA |
2nd Author's Affiliation | Graduate school of system informatics, Kobe University |
3rd Author's Name | Makoto NAGATA |
3rd Author's Affiliation | Faculty of Engineering, Kobe University |
4th Author's Name | DER PLAS Geert VAN |
4th Author's Affiliation | IMEC |
5th Author's Name | Jaemin KIM |
5th Author's Affiliation | IMEC |
6th Author's Name | Nikolaos MINAS |
6th Author's Affiliation | IMEC |
7th Author's Name | Pol MARCHAL |
7th Author's Affiliation | IMEC |
8th Author's Name | Michael LIBOIS |
8th Author's Affiliation | IMEC |
9th Author's Name | MANNA Antonio LA |
9th Author's Affiliation | IMEC |
10th Author's Name | Wenqi ZHANG |
10th Author's Affiliation | IMEC |
11th Author's Name | Julien RYCKAERT |
11th Author's Affiliation | IMEC |
12th Author's Name | Eric BEYNE |
12th Author's Affiliation | IMEC |
Date | 2012-08-02 |
Paper # | SDM2012-72,ICD2012-40 |
Volume (vol) | vol.112 |
Number (no) | 170 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |