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Presentation |
2012-08-02 14:40
Intra/Inter Tier Substrate Noise Measurements in 3D ICs Yasumasa Takagi, Yuuki Araga, Makoto Nagata (Kobe Univ.), Geert Van der Plas, Jaemin Kim, Nikolaos Minas, Pol Marchal, Michael Libois, Antonio La Manna, Wenqi Zhang, Julien Ryckaert, Eric Beyne (IMEC) |
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SDM2012-72 ICD2012-40 Link to ES Tech. Rep. Archives: SDM2012-72 ICD2012-40 |
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