Presentation | 2012-08-02 Reduced Drain Current Variability in Fully Depleted Silicon-on-Thin-BOX (SOTB) MOSFETs Tomoko MIZUTANI, Yoshiki YAMAMOTO, Hideki MAKIYAMA, Takaaki TSUNOMURA, Toshiaki IWAMATSU, Hidekazu ODA, Nobuyuki SUGII, Toshiro HIRAMOTO, |
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PDF Download Page | PDF download Page Link | |
Abstract(in Japanese) | (See Japanese page) | |
Abstract(in English) | Drain current variability in silicon-on-thin-BOX (SOTB) MOSFETs by 65nm technology is analyzed and compared with conventional bulk MOSFETs. It is found that drain current variability in SOTB MOSFETs is largely suppressed thanks to not only reduced V_ | variability but also reduced current-onset voltage (COV) variability due to intrinsic channel. |
Keyword(in Japanese) | (See Japanese page) | |
Keyword(in English) | Variability / Drain Current / FD SOI | |
Paper # | SDM2012-69,ICD2012-37 | |
Date of Issue |
Conference Information | |
Committee | ICD |
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Conference Date | 2012/7/26(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
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Paper Information | |
Registration To | Integrated Circuits and Devices (ICD) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Reduced Drain Current Variability in Fully Depleted Silicon-on-Thin-BOX (SOTB) MOSFETs |
Sub Title (in English) | |
Keyword(1) | Variability |
Keyword(2) | Drain Current |
Keyword(3) | FD SOI |
1st Author's Name | Tomoko MIZUTANI |
1st Author's Affiliation | Institute of Industrial Science, University of Tokyo() |
2nd Author's Name | Yoshiki YAMAMOTO |
2nd Author's Affiliation | Low-power Electronics Association & Project (LEAP) |
3rd Author's Name | Hideki MAKIYAMA |
3rd Author's Affiliation | Low-power Electronics Association & Project (LEAP) |
4th Author's Name | Takaaki TSUNOMURA |
4th Author's Affiliation | Low-power Electronics Association & Project (LEAP) |
5th Author's Name | Toshiaki IWAMATSU |
5th Author's Affiliation | Low-power Electronics Association & Project (LEAP) |
6th Author's Name | Hidekazu ODA |
6th Author's Affiliation | Low-power Electronics Association & Project (LEAP) |
7th Author's Name | Nobuyuki SUGII |
7th Author's Affiliation | Low-power Electronics Association & Project (LEAP) |
8th Author's Name | Toshiro HIRAMOTO |
8th Author's Affiliation | Institute of Industrial Science, University of Tokyo |
Date | 2012-08-02 |
Paper # | SDM2012-69,ICD2012-37 |
Volume (vol) | vol.112 |
Number (no) | 170 |
Page | pp.pp.- |
#Pages | 4 |
Date of Issue |