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| Presentation | 2012-08-02 13:25 Reduced Drain Current Variability in Fully Depleted Silicon-on-Thin-BOX (SOTB) MOSFETs Tomoko Mizutani (Univ. of Tokyo), Yoshiki Yamamoto, Hideki Makiyama, Takaaki Tsunomura, Toshiaki Iwamatsu, Hidekazu Oda, Nobuyuki Sugii (LEAP), Toshiro Hiramoto (Univ. of Tokyo) |
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| PDF Download Link |  SDM2012-69 ICD2012-37 Link to ES Tech. Rep. Archives: SDM2012-69 ICD2012-37 |
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