Presentation 2008-10-17
An analysis of relationship between code clone length and software reliability
Hiroki SATO, Yasutaka KAMEI, Hidetake UWANO, Akito MONDEN, Shinji KAWAGUCHI, Masataka NAGURA, Ken-ichi MATSUMOTO, Hajimu IIDA,
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Abstract(in English) A code clone that is duplicated code section in source files makes software maintenance more difficult. However, to our knowledge, no study has analyzed how the code clone influences software reliability. In this paper, we focused on the length of the code clone in order to analyze the relation between software reliability and code clone. We analyzed a repository of a project, classified source code files according to the length of the code clone included in the files, and measured the bug density of each classified file group. As a result, it was clarified that (1) the bug density of the file group that contained a short code clone was high, and (2) the bug density of the file group that contained a long code clone was low. In addition, because we had thought the bug density was influenced from the length of each source code file, we classified the files by measuring lines of source code and examined how much the bug density of each file group changed. We observed that the result (1), (2) became more pronounced when lines of source code was comparatively large.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Code clone / Length of code clone / Software reliability / Bug density
Paper # SS2008-34
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Committee SS
Conference Date 2008/10/9(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) An analysis of relationship between code clone length and software reliability
Sub Title (in English)
Keyword(1) Code clone
Keyword(2) Length of code clone
Keyword(3) Software reliability
Keyword(4) Bug density
1st Author's Name Hiroki SATO
1st Author's Affiliation Nara Institute of Science and Technology()
2nd Author's Name Yasutaka KAMEI
2nd Author's Affiliation Nara Institute of Science and Technology
3rd Author's Name Hidetake UWANO
3rd Author's Affiliation Nara Institute of Science and Technology
4th Author's Name Akito MONDEN
4th Author's Affiliation Nara Institute of Science and Technology
5th Author's Name Shinji KAWAGUCHI
5th Author's Affiliation Nara Institute of Science and Technology
6th Author's Name Masataka NAGURA
6th Author's Affiliation Nara Institute of Science and Technology
7th Author's Name Ken-ichi MATSUMOTO
7th Author's Affiliation Nara Institute of Science and Technology
8th Author's Name Hajimu IIDA
8th Author's Affiliation Nara Institute of Science and Technology
Date 2008-10-17
Paper # SS2008-34
Volume (vol) vol.108
Number (no) 242
Page pp.pp.-
#Pages 6
Date of Issue