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2008-10-17 09:20
An analysis of relationship between code clone length and software reliability Hiroki Sato, Yasutaka Kamei, Hidetake Uwano, Akito Monden, Shinji Kawaguchi, Masataka Nagura, Ken-ichi Matsumoto, Hajimu Iida (NAIST) |
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SS2008-34 |
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