| Presentation | 2008-06-27 Evaluation of Contact Resistance between Organic Semiconductor and Conductive AFM probes for Potential Mapping Yuki SAKAI, Yoshitaka SUGITA, Takahito SUZUKI, Makai TANEMURA, Yasuo NAKAYAMA, Hisao ISHII, Masatoshi SAKAI, Masakazu NAKAMURA, Kazuhiro KUDO, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | AFM potentiometry, which is highly accurate of the analysis of potential distribution, is useful for the clarification of the characteristic limitation factor of organic thin-film transistors. However, there is a problem with low measurement yield, and it is suspected that the contact resistance between the organic semiconductor and the conductive probe is the considerable cause. In this work, the contact resistance between various conductive probes and pentacene was evaluated by AFM current measurement. As a result, it was confirmed that initial contact resistance of Pt-coated probe which is coated by a specific condition and carbon nanofiber (CNF) probe is low. It was also confirmed that the work function of CNF especially in a nitrogen atmosphere is almost equal to the top of pentacene HOMO. This would be a cause of the low contact resistance of CNF. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | AFM Potentiometry / Pentacene / Organic TFT / Conductive probe / Contact resistance / CNF |
| Paper # | EMD2008-18,CPM2008-37,OME2008-39 |
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| Conference Information | |
| Committee | OME |
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| Conference Date | 2008/6/20(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Organic Material Electronics (OME) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Evaluation of Contact Resistance between Organic Semiconductor and Conductive AFM probes for Potential Mapping |
| Sub Title (in English) | |
| Keyword(1) | AFM Potentiometry |
| Keyword(2) | Pentacene |
| Keyword(3) | Organic TFT |
| Keyword(4) | Conductive probe |
| Keyword(5) | Contact resistance |
| Keyword(6) | CNF |
| 1st Author's Name | Yuki SAKAI |
| 1st Author's Affiliation | Faculty of Engineering, Chiba University() |
| 2nd Author's Name | Yoshitaka SUGITA |
| 2nd Author's Affiliation | Graduate School of Engineering, Nagoya Institute of Technology |
| 3rd Author's Name | Takahito SUZUKI |
| 3rd Author's Affiliation | Graduate School of Engineering, Nagoya Institute of Technology |
| 4th Author's Name | Makai TANEMURA |
| 4th Author's Affiliation | Graduate School of Engineering, Nagoya Institute of Technology |
| 5th Author's Name | Yasuo NAKAYAMA |
| 5th Author's Affiliation | Graduate School of Advanced Integration Chiba University |
| 6th Author's Name | Hisao ISHII |
| 6th Author's Affiliation | Graduate School of Advanced Integration Chiba University |
| 7th Author's Name | Masatoshi SAKAI |
| 7th Author's Affiliation | Faculty of Engineering, Chiba University |
| 8th Author's Name | Masakazu NAKAMURA |
| 8th Author's Affiliation | Faculty of Engineering, Chiba University |
| 9th Author's Name | Kazuhiro KUDO |
| 9th Author's Affiliation | Faculty of Engineering, Chiba University |
| Date | 2008-06-27 |
| Paper # | EMD2008-18,CPM2008-37,OME2008-39 |
| Volume (vol) | vol.108 |
| Number (no) | 112 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |