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Presentation |
2008-06-27 15:30
Evaluation of Contact Resistance between Organic Semiconductor and Conductive AFM probes for Potential Mapping Yuki Sakai (Chiba Univ.), Yoshitaka Sugita, Takahito Suzuki, Masaki Tanemura (Nagoya Inst. Technol.), Yasuo Nakayama, Hisao Ishii, Masatoshi Sakai, Masakazu Nakamura, Kazuhiro Kudo (Chiba Univ.) |
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EMD2008-18 CPM2008-37 OME2008-39 Link to ES Tech. Rep. Archives: EMD2008-18 CPM2008-37 OME2008-39 |
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