| Presentation | 2006-11-28 Test relaxation for N-detection test patterns in broad-side delay testing Kenjiro Taniguchi, Kohei Miyase, Seiji Kajihara, Xiaoqing Wen, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Developing DSM technologies, delay testing is getting more and more important. Generating N-detection test patterns for transitional delay faults can enhance the defect coverage. But the delay testing with an N-detection test set has a problem about test cost. A solution to the test cost problem is to identify Xs in the N-detection test set and to use the Xs for test compaction/compression. In this paper, we propose a method of test relaxation in an N-detection test set for transition delay faults using the broadside testing. Experimental results for benchmark circuits show that the proposed method can identify don't care bits in a given test set effectively. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Don't care identification / Transitional fault / Broad-side testing / N-detection test |
| Paper # | VLD2006-57,DC2006-44 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2006/11/21(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Test relaxation for N-detection test patterns in broad-side delay testing |
| Sub Title (in English) | |
| Keyword(1) | Don't care identification |
| Keyword(2) | Transitional fault |
| Keyword(3) | Broad-side testing |
| Keyword(4) | N-detection test |
| 1st Author's Name | Kenjiro Taniguchi |
| 1st Author's Affiliation | Department of Computer Science and Electronics, Kyushu Institute of Technology() |
| 2nd Author's Name | Kohei Miyase |
| 2nd Author's Affiliation | Innovation Plaza, Fukuoka, Japan Science and Technology Agency |
| 3rd Author's Name | Seiji Kajihara |
| 3rd Author's Affiliation | Department of Computer Science and Electronics, Kyushu Institute of Technology |
| 4th Author's Name | Xiaoqing Wen |
| 4th Author's Affiliation | Department of Computer Science and Electronics, Kyushu Institute of Technology |
| Date | 2006-11-28 |
| Paper # | VLD2006-57,DC2006-44 |
| Volume (vol) | vol.106 |
| Number (no) | 390 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |