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Presentation
2006-11-28 11:45
Test relaxation for N-detection test patterns in broad-side delay testing
Kenjiro Taniguchi
(
Kyushu Inst. of Tech.
),
Kohei Miyase
(
JST
),
Seiji Kajihara
,
Xiaoqing Wen
(
Kyushu Inst. of Tech.
)
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