| Presentation | 2017-05-26 Characterization of GaN epilayers grown on GaN substrates by a microwave photoconductivity decay method Takato Asada, Yoshihito Ichikawa, Kenji Ito, Kazuyoshi Tomita, Tetsuo Narita, Tetsu Kachi, Masashi Kato, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | |
| Paper # | ED2017-25,CPM2017-11,SDM2017-19 |
| Date of Issue | 2017-05-18 (ED, CPM, SDM) |
| Conference Information | |
| Committee | SDM / ED / CPM |
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| Conference Date | 2017/5/25(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | VBL, Nagoya University |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Tatsuya Kunikiyo(Renesas) / Koichi Maezawa(Univ. of Toyama) / Satoru Noge(Numazu National College of Tech.) |
| Vice Chair | Takahiro Shinada(Tohoku Univ.) / Kunio Tsuda(Toshiba) / Fumihiko Hirose(Yamagata Univ.) |
| Secretary | Takahiro Shinada(Tohoku Univ.) / Kunio Tsuda(Renesas) / Fumihiko Hirose(JAIST) |
| Assistant | Hiroya Ikeda(Shizuoka Univ.) / Masataka Higashiwaki(NICT) / Toshiyuki Oishi(Saga Univ.) / Takashi Sakamoto(NTT) / Yuichi Nakamura(Toyohashi Univ. of Tech.) |
| Paper Information | |
| Registration To | Technical Committee on Silicon Device and Materials / Technical Committee on Electron Devices / Technical Committee on Component Parts and Materials |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Characterization of GaN epilayers grown on GaN substrates by a microwave photoconductivity decay method |
| Sub Title (in English) | |
| Keyword(1) | |
| 1st Author's Name | Takato Asada |
| 1st Author's Affiliation | Nagoya Institute of Technology(N.I.Tech) |
| 2nd Author's Name | Yoshihito Ichikawa |
| 2nd Author's Affiliation | Nagoya Institute of Technology(NITech) |
| 3rd Author's Name | Kenji Ito |
| 3rd Author's Affiliation | Toyota Central R&D Labs., Inc.(Toyota Central R&D Labs.) |
| 4th Author's Name | Kazuyoshi Tomita |
| 4th Author's Affiliation | Toyota Central R&D Labs., Inc.(Toyota Central R&D Labs.) |
| 5th Author's Name | Tetsuo Narita |
| 5th Author's Affiliation | Toyota Central R&D Labs., Inc.(Toyota Central R&D Labs.) |
| 6th Author's Name | Tetsu Kachi |
| 6th Author's Affiliation | Nagoya University(Nagoya Univ.) |
| 7th Author's Name | Masashi Kato |
| 7th Author's Affiliation | Nagoya Institute of Technology(NITech) |
| Date | 2017-05-26 |
| Paper # | ED2017-25,CPM2017-11,SDM2017-19 |
| Volume (vol) | vol.117 |
| Number (no) | ED-58,CPM-59,SDM-60 |
| Page | pp.pp.55-58(ED), pp.55-58(CPM), pp.55-58(SDM), |
| #Pages | 4 |
| Date of Issue | 2017-05-18 (ED, CPM, SDM) |