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2017-05-26 10:20
Characterization of GaN epilayers grown on GaN substrates by a microwave photoconductivity decay method Takato Asada (N.I.Tech), Yoshihito Ichikawa (NITech), Kenji Ito, Kazuyoshi Tomita, Tetsuo Narita (Toyota Central R&D Labs.), Tetsu Kachi (Nagoya Univ.), Masashi Kato (NITech) |
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ED2017-25 CPM2017-11 SDM2017-19 Link to ES Tech. Rep. Archives: ED2017-25 CPM2017-11 SDM2017-19 |
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