| Presentation | 2017-04-21 [Invited Lecture] Highly reliable Cu atom switch using thermally tolerant Polymer-solid Electrolyte (TT-PSE) for Nonvolatile Programmable Logic Koichiro Okamoto, Munehiro Tada, Naoki Banno, Noriyuki Iguchi, Hiromitsu Hada, Toshitsugu Sakamoto, Makoto Miyamura, Yukihide Tsuji, Ryusuke Nebashi, Ayuka Morioka, Xu Bai, Tadahiko Sugibayashi, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Robust Cu atom switch with higher operation reliability has been developed featuring an over-400C thermally tolerant polymer-solid electrolyte (TT-PSE).The improved thermal tolerance of PSE enables atom switch integration using standard Cu-BEOL (fully 400oC) process. The TT-PSE also gives higher breakdown voltage (+1V) with keeping low set voltage (2V). Data retention characteristics after thermal cycle stress at temperature ranging from -65 to 150C for 1000 cycles are also confirmed for the first time. The developed atom switch is to be a technology enabler of reliable reprogrammable logics for future applications operated at high temperatures. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Atom switch / Crossbar / Nonvolatile programmable logic |
| Paper # | ICD2017-13 |
| Date of Issue | 2017-04-13 (ICD) |
| Conference Information | |
| Committee | ICD |
|---|---|
| Conference Date | 2017/4/20(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Minoru Fujishima(Hiroshima Univ.) |
| Vice Chair | Hideto Hidaka(Renesas) |
| Secretary | Hideto Hidaka(Hiroshima Univ.) |
| Assistant | Takashi Hashimoto(Panasonic) / Masanori Natsui(Tohoku Univ.) / Hiroyuki Ito(Tokyo Inst. of Tech.) / Pham Konkuha(Univ. of Electro-Comm.) |
| Paper Information | |
| Registration To | Technical Committee on Integrated Circuits and Devices |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | [Invited Lecture] Highly reliable Cu atom switch using thermally tolerant Polymer-solid Electrolyte (TT-PSE) for Nonvolatile Programmable Logic |
| Sub Title (in English) | |
| Keyword(1) | Atom switch |
| Keyword(2) | Crossbar |
| Keyword(3) | Nonvolatile programmable logic |
| 1st Author's Name | Koichiro Okamoto |
| 1st Author's Affiliation | NEC Corporation(NEC) |
| 2nd Author's Name | Munehiro Tada |
| 2nd Author's Affiliation | NEC Corporation(NEC) |
| 3rd Author's Name | Naoki Banno |
| 3rd Author's Affiliation | NEC Corporation(NEC) |
| 4th Author's Name | Noriyuki Iguchi |
| 4th Author's Affiliation | NEC Corporation(NEC) |
| 5th Author's Name | Hiromitsu Hada |
| 5th Author's Affiliation | NEC Corporation(NEC) |
| 6th Author's Name | Toshitsugu Sakamoto |
| 6th Author's Affiliation | NEC Corporation(NEC) |
| 7th Author's Name | Makoto Miyamura |
| 7th Author's Affiliation | NEC Corporation(NEC) |
| 8th Author's Name | Yukihide Tsuji |
| 8th Author's Affiliation | NEC Corporation(NEC) |
| 9th Author's Name | Ryusuke Nebashi |
| 9th Author's Affiliation | NEC Corporation(NEC) |
| 10th Author's Name | Ayuka Morioka |
| 10th Author's Affiliation | NEC Corporation(NEC) |
| 11th Author's Name | Xu Bai |
| 11th Author's Affiliation | NEC Corporation(NEC) |
| 12th Author's Name | Tadahiko Sugibayashi |
| 12th Author's Affiliation | NEC Corporation(NEC) |
| Date | 2017-04-21 |
| Paper # | ICD2017-13 |
| Volume (vol) | vol.117 |
| Number (no) | ICD-9 |
| Page | pp.pp.67-72(ICD), |
| #Pages | 6 |
| Date of Issue | 2017-04-13 (ICD) |