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Presentation |
2017-04-21 11:00
[Invited Lecture]
Highly reliable Cu atom switch using thermally tolerant Polymer-solid Electrolyte (TT-PSE) for Nonvolatile Programmable Logic Koichiro Okamoto, Munehiro Tada, Naoki Banno, Noriyuki Iguchi, Hiromitsu Hada, Toshitsugu Sakamoto, Makoto Miyamura, Yukihide Tsuji, Ryusuke Nebashi, Ayuka Morioka, Xu Bai, Tadahiko Sugibayashi (NEC) |
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ICD2017-13 Link to ES Tech. Rep. Archives: ICD2017-13 |
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