| Presentation | 2017-04-21 [Invited Lecture] A 55nm Ultra Low Leakage Deeply Depleted Channel Technology Optimized for Energy Minimization in Subthreshold SRAM and Logic Harsh N. Patel, Abhishek Roy, Farah B. Yahya, Ningxi Liu, Benton Calhoun, Akihiko Harada, Kazuyuki Kumeno, Makoto Yasuda, Taiji Ema, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | This paper presents an Ultra-Low Leakage (ULL) 55nm Deeply Depleted Channel (DDC) process technology. The 6T SRAM array operates reliably down to 200mV, and the FIR filter consumes just 4.5pJ/cycle. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | DDC / ULL / Sub-threshold / SRAM / FIR / Ultra Low Leak |
| Paper # | ICD2017-11 |
| Date of Issue | 2017-04-13 (ICD) |
| Conference Information | |
| Committee | ICD |
|---|---|
| Conference Date | 2017/4/20(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Minoru Fujishima(Hiroshima Univ.) |
| Vice Chair | Hideto Hidaka(Renesas) |
| Secretary | Hideto Hidaka(Hiroshima Univ.) |
| Assistant | Takashi Hashimoto(Panasonic) / Masanori Natsui(Tohoku Univ.) / Hiroyuki Ito(Tokyo Inst. of Tech.) / Pham Konkuha(Univ. of Electro-Comm.) |
| Paper Information | |
| Registration To | Technical Committee on Integrated Circuits and Devices |
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| Language | ENG |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | [Invited Lecture] A 55nm Ultra Low Leakage Deeply Depleted Channel Technology Optimized for Energy Minimization in Subthreshold SRAM and Logic |
| Sub Title (in English) | |
| Keyword(1) | DDC |
| Keyword(2) | ULL |
| Keyword(3) | Sub-threshold |
| Keyword(4) | SRAM |
| Keyword(5) | FIR |
| Keyword(6) | Ultra Low Leak |
| 1st Author's Name | Harsh N. Patel |
| 1st Author's Affiliation | University of Virginia(UVA) |
| 2nd Author's Name | Abhishek Roy |
| 2nd Author's Affiliation | University of Virginia(UVA) |
| 3rd Author's Name | Farah B. Yahya |
| 3rd Author's Affiliation | University of Virginia(UVA) |
| 4th Author's Name | Ningxi Liu |
| 4th Author's Affiliation | University of Virginia(UVA) |
| 5th Author's Name | Benton Calhoun |
| 5th Author's Affiliation | University of Virginia(UVA) |
| 6th Author's Name | Akihiko Harada |
| 6th Author's Affiliation | Fujitsu Electronics America(FEA) |
| 7th Author's Name | Kazuyuki Kumeno |
| 7th Author's Affiliation | Mie Fujitsu Semiconductor(MIFS) |
| 8th Author's Name | Makoto Yasuda |
| 8th Author's Affiliation | Mie Fujitsu Semiconductor(MIFS) |
| 9th Author's Name | Taiji Ema |
| 9th Author's Affiliation | Mie Fujitsu Semiconductor(MIFS) |
| Date | 2017-04-21 |
| Paper # | ICD2017-11 |
| Volume (vol) | vol.117 |
| Number (no) | ICD-9 |
| Page | pp.pp.57-61(ICD), |
| #Pages | 5 |
| Date of Issue | 2017-04-13 (ICD) |