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| Presentation | 2017-04-21 10:00 [Invited Lecture] A 55nm Ultra Low Leakage Deeply Depleted Channel Technology Optimized for Energy Minimization in Subthreshold SRAM and Logic Harsh N. Patel, Abhishek Roy, Farah B. Yahya, Ningxi Liu, Benton Calhoun (UVA), Akihiko Harada (FEA), Kazuyuki Kumeno, Makoto Yasuda, Taiji Ema (MIFS) |
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| PDF Download Link |  ICD2017-11 Link to ES Tech. Rep. Archives: ICD2017-11 |
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