Information and Systems-Dependable Computing(Date:2024/02/28)

Presentation
Locating High Power Consuming Area by Topology Analysis for Logic Circuit

Tomoya Yamashita(Kyutech),  Kohei Miyase(Kyutech),  Xiaoqing Wen(Kyutech),  

[Date]2024-02-28
[Paper #]DC2023-101
On Additional Status Signal Sequences Generation to Improve Estimated Field Random Testability for Datapaths at Register Transfer Level

Yudai Toyooka(Nihon Univ.),  Toshinori Hosokawa(Nihon Univ.),  Masayoshi Yoshimura(Kyoto Sangyo Univ.),  

[Date]2024-02-28
[Paper #]DC2023-102
A Low Power Oriented Multiple Target Test Generation Method for 2 Cycle Gate-Exhaustive Faults Using Pseudo Boolean Optimization

Momona Mizota(Nihon Univ),  Toshinori Hosokawa(Nihon Univ),  Masayoshi Yoshimura(Kyouto Sangyou Uni),  Masayuki Arai(Nihon Univ),  

[Date]2024-02-28
[Paper #]DC2023-99
A Study on Test Generation for Alleviating Over-testing of Approximate Multipliers

Qilin Wang(Hiroshima City Univ.),  Hideyuki Ichihara(Hiroshima City Univ.),  Tomoo Inoue(Hiroshima City Univ.),  

[Date]2024-02-28
[Paper #]DC2023-97
A Proposal of Node Selection Method in Interdependent Networks

Koki Matsui(Osaka Univ.),  Tatsuhiro Tsuchiya(Osaka Univ.),  

[Date]2024-02-28
[Paper #]DC2023-103
Specifying and verifying fault-tolerant consensus algorithms using PlusCAL

Aoi Ono(Osaka Univ.),  Tatsuhiro Tsuchiya(Osaka Univ.),  

[Date]2024-02-28
[Paper #]DC2023-96
System design using DICE-based edge-triggered soft-error-tolerant D-FF

Kazuteru Namba(Chiba Univ.),  

[Date]2024-02-28
[Paper #]DC2023-95
Test Point Selection Method for Multi-Cycle BIST Using Deep Reinforcement Learning

Kohei Shiotani(Ehime Univ.),  Tatsuya Nishikawa(Ehime Univ.),  Shaoqi Wei(Ehime Univ.),  Senling Wang(Ehime Univ.),  Hiroshi Kai(Ehime Univ.),  Yoshinobu Higami(Ehime Univ.),  Hiroshi Takahashi(Ehime Univ.),  

[Date]2024-02-28
[Paper #]DC2023-98
A Low Power Multi Bit Passive ΔΣ Modulator for Wearable Devices

Naoya Maruyama(Tokyo Denki Univ.),  Satoshi Komatsu(Tokyo Denki Univ.),  

[Date]2024-02-28
[Paper #]DC2023-94
CapsNetによるウェハマップ欠陥パターン分類精度の改善

Yuki Yamanaka(Tokyo Metro. Univ.),  Yoshikazu Nagamura(Tokyo Metro. Univ.),  Masayuki Arai(Nihon Univ.),  Satoshi Fukumoto(Tokyo Metro. Univ.),  

[Date]2024-02-28
[Paper #]DC2023-100