| Presentation | 2024-02-28 A Study on Test Generation for Alleviating Over-testing of Approximate Multipliers Qilin Wang, Hideyuki Ichihara, Tomoo Inoue, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In this study, we discuss the alleviation of over-testing for approximate circuits. We target a design of approximate multipliers with recovery schemes whose ability of error recovery can be designed according to the requirement of its application. We present an algorithm for generating test-patterns that can detect all the unacceptable faults with keeping the number of acceptable faults detected accidentally small. By applying this test generation algorithm, we analyze the relationship between the design of approximate multipliers with recovery schemes and the over-testing alleviation (or effective yield enhancement). |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Error-tolerant application (ETA) / acceptable faults / alleviating over-testing / test generation / effective yield |
| Paper # | DC2023-97 |
| Date of Issue | 2024-02-21 (DC) |
| Conference Information | |
| Committee | DC |
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| Conference Date | 2024/2/28(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Tatsuhiro Tsuchiya(Osaka Univ.) |
| Vice Chair | Toshinori Hosokawa(Nihon Univ.) |
| Secretary | Toshinori Hosokawa(Nihon Univ.) |
| Assistant | |
| Paper Information | |
| Registration To | Technical Committee on Dependable Computing |
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| Language | ENG-JTITLE |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Study on Test Generation for Alleviating Over-testing of Approximate Multipliers |
| Sub Title (in English) | |
| Keyword(1) | Error-tolerant application (ETA) |
| Keyword(2) | acceptable faults |
| Keyword(3) | alleviating over-testing |
| Keyword(4) | test generation |
| Keyword(5) | effective yield |
| 1st Author's Name | Qilin Wang |
| 1st Author's Affiliation | Hiroshima City University(Hiroshima City Univ.) |
| 2nd Author's Name | Hideyuki Ichihara |
| 2nd Author's Affiliation | Hiroshima City University(Hiroshima City Univ.) |
| 3rd Author's Name | Tomoo Inoue |
| 3rd Author's Affiliation | Hiroshima City University(Hiroshima City Univ.) |
| Date | 2024-02-28 |
| Paper # | DC2023-97 |
| Volume (vol) | vol.123 |
| Number (no) | DC-389 |
| Page | pp.pp.17-22(DC), |
| #Pages | 6 |
| Date of Issue | 2024-02-21 (DC) |