Engineering Sciences/NOLTA-Reliability(Date:2023/06/15)

Presentation
CNN-based cause analysis of metrology data mismatch between multiple CD-SEMs

Naoya Tanahashi(Hitachi),  Shintaro Takada(Hitachi),  

[Date]2023-06-15
[Paper #]R2023-8
A Note on Acceleration of Perfect Sampling Algorithm for Stochastic Petri Nets with SMT Solver

Hiroyuki Okamura(Hiroshima Univ.),  Sayaka Ando(Hiroshima Univ.),  Tadashi Dohi(Hiroshima Univ.),  

[Date]2023-06-15
[Paper #]R2023-9
Change-point Detection of Fault Counting Data Based on Anomaly Detection Methodology for Software Reliability Assessment

Shin Danjo(Tottori Univ),  Yuka Minamino(Tottori Univ),  Masashi Kuwano(Tottori Univ),  Taku Moriyama(Yokohama City Univ),  Shinji Inoue(Kansai Univ),  

[Date]2023-06-15
[Paper #]R2023-7