Engineering Sciences/NOLTA-Reliability(Date:1999/11/19)

Presentation
表紙

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[Date]1999/11/19
[Paper #]
目次

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[Date]1999/11/19
[Paper #]
Safety Integrity Levels Model for IEC 61508-Functional Safety : A few modifications on its algorithm

Eiichi Kato,  Yoshinobu Sato,  Michio Horigome,  

[Date]1999/11/19
[Paper #]R99-18
The Influence of Impact Stress Due to Stud Bumping on Device Degradation Region in Scaled MOSFETs

Nobuhiro Shimoyama,  Katsuyuki Machida,  Hiroshi Koizumi,  Masakazu Shimaya,  Hakaru Kyuragi,  

[Date]1999/11/19
[Paper #]R99-19
Estimation of light emitting diode's operation Life time

Hiroaki Shono,  

[Date]1999/11/19
[Paper #]R99-20
The Effect of Collector Condition on hFE Degradation Under Emitter-Base Reverse Bias Stress

Satoru Yasuda,  Masami Satsutani,  Shinji Nakano,  

[Date]1999/11/19
[Paper #]R99-21
Influence of Program/Erase upon Reliability on Flash Memory

Ichiro Minekawa,  Tsuyoshi Kato,  Shinji Nakano,  

[Date]1999/11/19
[Paper #]R99-22
Backside Electron Beam Testing Method for Flip Chip

Eiji Yoshida,  Taichi Nakashima,  Tohru Koyama,  Junko Komori,  Yoji Mashiko,  

[Date]1999/11/19
[Paper #]R99-23
[OTHERS]

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[Date]1999/11/19
[Paper #]