Electronics-Silicon Devices and Materials(Date:2006/11/17)

Presentation
表紙

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[Date]2006/11/17
[Paper #]
目次

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[Date]2006/11/17
[Paper #]
Fault Detection Technique by Using Transistor Operating Point Analysis : Influence of Logic Operation on Leakage Fault

Masaru Sanada,  

[Date]2006/11/17
[Paper #]R2006-31,ED2006-176,SDM2006-194
Fabrication of iron silicides photonic crystals

Shunsuke KUNIMATSU,  Akifumi IMAI,  Kensuke AKIYAMA,  Yoshihito MAEDA,  

[Date]2006/11/17
[Paper #]R2006-32,ED2006-177,SDM2006-195
Ion beam synthesis of β-FeSi_2 : Dependence of Si vacancy on annealing time

Takafumi JONISHI,  Yu-ichiro ANDO,  Yoshihito MAEDA,  

[Date]2006/11/17
[Paper #]R2006-33,ED2006-178,SDM2006-196
Hot-carrier reliability in Trench Lateral Power MOSFETs

Mutsumi Sawada,  Shinichiro Matsunaga,  Masaharu Yamaji,  Akio Kitamura,  Naoto Fujishima,  

[Date]2006/11/17
[Paper #]R2006-34,ED2006-179,SDM2006-197
Effects of heterointerface flatness on device performance of InP-based HEMT : Reduction of interface roughness scattering using (411)A-oriented substrate

Issei WATANABE,  Keisuke SHINOHARA,  Takahiro KITADA,  Satoshi SHIMOMURA,  Akira ENDOH,  Yoshimi YAMASHITA,  Takashi MIMURA,  Satoshi HIYAMIZU,  Toshiaki MATSUI,  

[Date]2006/11/17
[Paper #]R2006-35,ED2006-180,SDM2006-198
Surface passivation dependency of 1/f noise characterization in AlGaN/GaN HEMT

T. Matsushima,  M. Nakajima,  K. Nomoto,  M. Satoh,  T. Nakamura,  

[Date]2006/11/17
[Paper #]R2006-36,ED2006-181,SDM2006-199
Study on Degradation of Gate-Length Dependence of Transconductance in AlGaN/GaN HFETs with Nanometer-Size Gates

Seiya KASAI,  Alberto F. BASILE,  Tamotsu HASHIZUME,  

[Date]2006/11/17
[Paper #]R2006-37,ED2006-182,SDM2006-200
Surface Passivation of AlGaN/GaN HFETs by a Sputtered AlN Thin Film

Hiroaki Ueno,  Tomohiro Murata,  Hidetoshi Ishida,  Tetsuzo Ueda,  Yasuhiro Uemoto,  Tsuyoshi Tanaka,  Kaoru Inoue,  

[Date]2006/11/17
[Paper #]R2006-38,ED2006-183,SDM2006-201
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[Date]2006/11/17
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[Date]2006/11/17
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[Date]2006/11/17
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