Electronics-Integrated Circuits and Devices(Date:2023/10/31)

Presentation
Fundamental Study on Fault Analysis Based on Glitch Injection into Phase-Locked Loop

Hikaru Nishiyama(NAIST),  Daisuke Fujimoto(NAIST),  Yuichi Hayashi(NAIST),  

[Date]2023-10-31
[Paper #]HWS2023-55,ICD2023-34
CPA Toggle-Based Simulation against Modulus Multiplier for Pairing-based Cryptography

Saito Kikuoka(Tokyo Univ.),  Ikeda Makoto(Tokyo Univ.),  

[Date]2023-10-31
[Paper #]HWS2023-58,ICD2023-37
Side-Channel Leakage Evaluation of 3D CMOS Chip Stacking

Kazuki Monta(Kobe Univ.),  Rikuu Hasegawa(Kobe Univ.),  Takuji Miki(Kobe Univ.),  Makoto Nagata(Kobe Univ.),  

[Date]2023-10-31
[Paper #]HWS2023-57,ICD2023-36
Evaluation of Time-to-Digital Converter in Laser Fault Injection Detection on FPGA

Shungo Hayashi(YNU/AIST),  Junichi Sakamoto(YNU/AIST),  Masaki Chikano(YNU),  Tsutomu Matsumoto(YNU),  

[Date]2023-10-31
[Paper #]HWS2023-56,ICD2023-35
意図的な電磁波照射に対するカメラシステムのイミュニティ評価

Tanaka Myu(NAIST),  Fujimoto Daisuke(NAIST),  Hayashi Yuichi(NAIST),  

[Date]2023-10-31
[Paper #]HWS2023-54,ICD2023-33