Presentation 2023-10-31
Fundamental Study on Fault Analysis Based on Glitch Injection into Phase-Locked Loop
Hikaru Nishiyama, Daisuke Fujimoto, Yuichi Hayashi,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English)
Keyword(in Japanese) (See Japanese page)
Keyword(in English)
Paper # HWS2023-55,ICD2023-34
Date of Issue 2023-10-24 (HWS, ICD)

Conference Information
Committee ICD / HWS
Conference Date 2023/10/31(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English) Hardware Security, etc.
Chair Makoto Ikeda(Univ. of Tokyo) / Daisuke Suzuki(Mitsubishi Electric)
Vice Chair Hayato Wakabayashi(Sony Semiconductor Solutions) / Yuichi Hayashi(NAIST) / Toru Akishita(Sony Semiconductor Solutions)
Secretary Hayato Wakabayashi(Kioxia) / Yuichi Hayashi(Shinshu Univ.) / Toru Akishita(Sony Semiconductor Solutions)
Assistant Ryo Shirai(Kyoto Univ.) / Jun Shiomi(Osaka Univ.) / Takeshi Kuboki(Sony Semiconductor Solutions)

Paper Information
Registration To Technical Committee on Integrated Circuits and Devices / Technical Committee on Hardware Security
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Fundamental Study on Fault Analysis Based on Glitch Injection into Phase-Locked Loop
Sub Title (in English)
Keyword(1)
Keyword(2)
Keyword(3)
Keyword(4)
1st Author's Name Hikaru Nishiyama
1st Author's Affiliation Nara Institute of Science and Technology(NAIST)
2nd Author's Name Daisuke Fujimoto
2nd Author's Affiliation Nara Institute of Science and Technology(NAIST)
3rd Author's Name Yuichi Hayashi
3rd Author's Affiliation Nara Institute of Science and Technology(NAIST)
Date 2023-10-31
Paper # HWS2023-55,ICD2023-34
Volume (vol) vol.123
Number (no) HWS-235,ICD-236
Page pp.pp.5-9(HWS), pp.5-9(ICD),
#Pages 5
Date of Issue 2023-10-24 (HWS, ICD)