Electronics-Integrated Circuits and Devices(Date:2022/08/08)

Presentation
[Invited Talk] Optimal Cell Structure/Operation Design of 3D Semicircular Split-gate Cells for Ultra-high-density Flash Memory

Tetsu Morooka(Kioxia),  

[Date]2022-08-08
[Paper #]SDM2022-36,ICD2022-4
Evaluation of Steep Subthreshold Slope Device "Dual-gate type PN-body Tied SOI-FET" for Ultra-low Voltage Operation

Haruki Yonezaki(KIT),  Jiro Ida(KIT),  Takayuki Mori(KIT),  Koichiro Ishibashi(UEC),  

[Date]2022-08-08
[Paper #]SDM2022-38,ICD2022-6
[Invited Talk] A 2-Layer Transistor Pixel Stacked CMOS Image Sensor with Oxide Based Full Trench Isolation for Large Full Well Capacity and High Quantum Efficiency

Koichiro Zaitsu(Sony Semiconductor Solutions),  Akira Matsumoto(Sony Semiconductor Solutions),  Mizuki Nishida(Sony Semiconductor Solutions),  Yusuke Tanaka(Sony Semiconductor Solutions),  Hirofumi Yamashita(Sony Semiconductor Solutions),  Yosuke Satake(Sony Semiconductor Solutions),  Takashi Watanabe(Sony Semiconductor Manufacturing),  Kunihiko Araki(Sony Semiconductor Manufacturing),  Naoki Nei(Sony Semiconductor Manufacturing),  Keiichi Nakazawa(Sony Semiconductor Solutions),  Junpei Yamamoto(Sony Semiconductor Solutions),  Mutsuo Uehara(Sony Semiconductor Solutions),  Hiroyuki Kawashima(Sony Semiconductor Manufacturing),  Yusaku Kobayashi(Sony Semiconductor Manufacturing),  Tomoyuki Hirano(Sony Semiconductor Solutions),  Keiji Tatani(Sony Semiconductor Solutions),  

[Date]2022-08-08
[Paper #]SDM2022-33,ICD2022-1
[Invited Talk] Low-Noise Multi-Gate Pixel Transistor for Sub-Micron Pixel CMOS Image Sensors

Naohiko Kimizuka(Sony Semiconductor Solutions),  Shota Kitamura(Sony Semiconductor Solutions),  Akiko Honjo(Sony Semiconductor Solutions),  Koichi Baba(Sony Semiconductor Solutions),  Toshihiro Kurobe(Sony Semiconductor Solutions),  Hideomi Kumano(Sony Semiconductor Solutions),  Takuya Toyohuku(Sony Semiconductor Solutions),  Kouhei Takeuchi(Sony Semiconductor Manufacturing),  Shota Nishimura(Sony Semiconductor Manufacturing),  Akihiko Kato(Sony Semiconductor Solutions),  Tomoyuki Hirano(Sony Semiconductor Solutions),  Yusuke Oike(Sony Semiconductor Solutions),  

[Date]2022-08-08
[Paper #]SDM2022-34,ICD2022-2
A cryogenic digital-to-analog converter for high-fidelity control of large-scale qubit arrays

Ryozo Takahashi(Kobe Univ.),  Takuji Miki(Kobe Univ.),  Makoto Nagata(Kobe Univ.),  

[Date]2022-08-08
[Paper #]SDM2022-42,ICD2022-10
Evaluation of IC Chip Response by Backside Voltage Disturbance in Flip Chip Packaging

Takuya Wadatsumi(Kobe Univ.),  Kohei Kawai(Kobe Univ.),  Rikuu Hasegawa(Kobe Univ.),  Kikuo Muramatsu(e-SYNC),  Hiromu Hasegawa(Megachips),  Takuya Sawada(Megachips),  Takahito Fukushima(Megachips),  Hisashi Kondo(Megachips),  Takuji Miki(Kobe Univ.),  Makoto Nagata(Kobe Univ.),  

[Date]2022-08-08
[Paper #]SDM2022-40,ICD2022-8
Evaluation of Low-Latency Cryptography MANTIS based Low-Power oriented Tamper-Resistant Circuit

Kosuke Hamaguchi(Meijo Univ.),  Shu Takemoto(Meijo Univ.),  Yusuke Nozaki(Meijo Univ.),  Masaya Yoshikawa(Meijo Univ.),  

[Date]2022-08-08
[Paper #]SDM2022-41,ICD2022-9
[Invited Talk] Research on Steep Slope "PN-Body Tied SOI-FET" for Ultra Low Power LSI

Jiro Ida(Kanazawa IT),  Takayuki Mori(Kanazawa IT),  

[Date]2022-08-08
[Paper #]SDM2022-37,ICD2022-5
Sub-50-mV Input Boost Converter for Extremely Low-Voltage Thermal Energy Harvesting

Hikaru Sebe(Osaka Univ.),  Daisuke Kanemoto(Osaka Univ.),  Tetsuya Hirose(Osaka Univ.),  

[Date]2022-08-08
[Paper #]SDM2022-39,ICD2022-7
[Invited Talk] A 3.3-GHz 4.6-mW Fractional-N Type-II Hybrid Switched-Capacitor Sampling PLL Using CDAC-Embedded Digital Integral Path with -80-dBc Reference Spur

Zule Xu(UTokyo),  Masaru Osada(UTokyo),  Tetsuya Iizuka(UTokyo),  

[Date]2022-08-08
[Paper #]SDM2022-43,ICD2022-11
[Invited Talk] 0.37 W, 143 dB Dynamic Range 1 Megapixel Backside-Illuminated Charge Focusing SPAD Image Sensor with Pixel-Wise Exposure Control and Adaptive Clocked Recharging

Yu Maehashi(Canon),  Yasuharu Ota(Canon),  Kazuhiro Morimoto(Canon),  Tomoya Sasago(Canon),  Mahito Shinohara(Canon),  Yukihiro Kuroda(Canon),  Wataru Endo(Canon),  Shintaro Maekawa(Canon),  Masanao Motoyama(Canon),  Kenzo Tojima(Canon),  Hiroyuki Tsuchiya(Canon),  Ayman Abdelghafar(Canon),  Kosei Uehira(Canon),  Junji Iwata(Canon),  Fumihiro Inui(Canon),  Yasushi Matsuno(Canon),  Katsuhito Sakurai(Canon),  Takeshi Ichikawa(Canon),  

[Date]2022-08-08
[Paper #]SDM2022-35,ICD2022-3
TCAD Analysis for threshold voltage increase in cryogenic MOSFET operation

Hidehiro Asai(AIST),  Takumi Inaba(AIST),  Junichi Hattori(AIST),  Koichi Fukuda(AIST),  Hiroshi Oka(AIST),  Takahiro Mori(AIST),  

[Date]2022-08-09
[Paper #]SDM2022-47,ICD2022-15
[Invited Talk] Effect of Conduction Band Edge States on Coulomb-Limiting Electron Mobility in Cryogenic MOSFET Operation

Hiroshi Oka(AIST),  Takumi Inaba(AIST),  Shota Iizuka(AIST),  Hidehiro Asai(AIST),  Kimihiko Kato(AIST),  Takahiro Mori(AIST),  

[Date]2022-08-09
[Paper #]SDM2022-46,ICD2022-14
[Invited Talk] A low-power low-noise magnetoimpedance-based magnetometer with digital calibration technique

Ippei Akita(AIST),  Takeshi Kawano(Aichi Steel Corp.),  Hitoshi Aoyama(Aichi Steel Corp.),  Shunichi Tatematsu(Aichi Steel Corp.),  Masakazu Hioki(AIST),  

[Date]2022-08-09
[Paper #]SDM2022-44,ICD2022-12
[Invited Talk] A 38?m Range Precision Time-of-Flight CMOS Range Line Imager with Gating Driver Jitter Reduction Using Charge-Injection Pseudo Photocurrent Reference

Keita Yasutomi(Shizuoka Univ.),  Tatsuki Furuhashi(Shizuoka Univ.),  Koki Sagawa(Shizuoka Univ.),  Taishi Takasawa(Shizuoka Univ.),  Keiichiro Kagawa(Shizuoka Univ.),  Shoji Kawahito(Shizuoka Univ.),  

[Date]2022-08-09
[Paper #]SDM2022-45,ICD2022-13
IC with Integrated Imager and Ultra-Low Latency All-Digital In-Imager 2D Binary Convolutional Neural Network Accelerator for Image Classification

Wang Ruizhi(The Univ. of Tokyo),  Takamiya Makoto(The Univ. of Tokyo),  

[Date]2022-08-10
[Paper #]SDM2022-53,ICD2022-21
[Invited Talk] A 39-GHz CMOS Bi-Directional Doherty Phased-Array Beamformer Using Shared-LUT DPD with Inter-Element Mismatch Compensation Technique for 5G Base-Station

Zheng Li(Tokyo Tech),  Jian Pang(Tokyo Tech),  Yi Zhang(Tokyo Tech),  Yudai Yamazaki(Tokyo Tech),  Qiaoyu Wang(Tokyo Tech),  Peng Luo(Tokyo Tech),  Weichu Chen(Tokyo Tech),  Yijing Liao(Tokyo Tech),  Minzhe Tang(Tokyo Tech),  Zhengyan Guo(Tokyo Tech),  Yun Wang(Tokyo Tech),  Xi Fu(Tokyo Tech),  Dongwon You(Tokyo Tech),  Naoki Oshima(NEC),  Shinichi Hori(NEC),  Kazuaki Kunihiro(NEC),  Atsushi Shirane(Tokyo Tech),  Kenichi Okada(Tokyo Tech),  

[Date]2022-08-10
[Paper #]SDM2022-48,ICD2022-16
[Invited Talk] A CMOS Image Sensor and an AI Accelerator for Realizing Edge-Computing-Based Surveillance Camera Systems

Fukashi Morishita(Renesas Electronics),  Norihito Kato(Renesas Electronics),  Satoshi Okubo(Renesas Electronics),  Takao Toi(Renesas Electronics),  Mitsuru Hiraki(Renesas Electronics),  Sugako Otani(Renesas Electronics),  Hideaki Abe(Renesas Electronics),  Yuji Shinohara(Renesas Electronics),  Hiroyuki Kondo(Renesas Electronics),  

[Date]2022-08-10
[Paper #]SDM2022-52,ICD2022-20
[Invited Talk] A Power-Efficient Harmonic-Selection Phased-Array Receiver Supporting 24.25-71GHz Operation With 36dB Inter-Band Blocker Rejection

Jian Pang(Tokyo Tech),  Yi Zhang(Tokyo Tech),  Zheng Li(Tokyo Tech),  Minzhe Tang(Tokyo Tech),  Yijing Liao(Tokyo Tech),  Ashbir Aviat Fadila(Tokyo Tech),  Atsushi Shirane(Tokyo Tech),  Kenichi Okada(Tokyo Tech),  

[Date]2022-08-10
[Paper #]SDM2022-49,ICD2022-17
[Invited Talk] Introducing a new DNN inference chip (Hiddenite) based on hidden network theory

Masato Motomura(TokyoTech),  

[Date]2022-08-10
[Paper #]
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