Electronics-Electron Devices(Date:1998/03/13)

Presentation
表紙

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[Date]1998/3/13
[Paper #]
目次

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[Date]1998/3/13
[Paper #]
Preparation of Thin Film Layered Electrode for Microwave Devices : Effect of conductor loss reduction and its application

Masato Kobayashi,  Mitsuru Nakano,  Masatoshi Nakagawa,  Yuzo Katayama,  

[Date]1998/3/13
[Paper #]
Highly-Reliable Ferroelectric Memory Technology

Eiji Fujii,  

[Date]1998/3/13
[Paper #]
Degradation of electrical characteristics of Pt/Pb(Zr, Ti)O_3/Pt capacitors during H_2 annealing

Hiroshi Miki,  Yasuhiro Shimamoto,  Keiko Kushida,  Kazuyoshi Torii,  Yoshihisa Fujisaki,  

[Date]1998/3/13
[Paper #]
Properties of Pb(Zr, Ti)O_3 Thin Films Grown by MOCVD and Their Applications to Memory Devices

Masaru Shimizu,  Tadashi Shiosaki,  

[Date]1998/3/13
[Paper #]
PZT Thin Films for Application to Nonvolatile Memories

Takashi Nakamura,  

[Date]1998/3/13
[Paper #]
Variation of ferroelectric properties with temperature in SBT thin films

Takashi Hase,  Takehiro Noguchi,  Koichi Takemura,  Yoichi Miyasaka,  

[Date]1998/3/13
[Paper #]
Formation of highly-insulating and-capacitive Ta_2O_5 films by the low temperature process : Improvement of electrical properties in Ta_2O_5 capacitor films

B.K. Moon,  J Aoyama,  C Isobe,  K Katori,  

[Date]1998/3/13
[Paper #]
Low Temperature Preparation of SrBi_2Ta_2O_9 and PZT Thin Films and Their Functional Devices

Masanori OKUYAMA,  Yoshinori MATSUMURO,  Tomofumi KIYOMOTO,  Yasuomi MORIKAWA,  XU Huaping,  Kaoru YAMASHITA,  Minoru NODA,  

[Date]1998/3/13
[Paper #]
[OTHERS]

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[Date]1998/3/13
[Paper #]