| Presentation | 1998/3/13 Variation of ferroelectric properties with temperature in SBT thin films Takashi Hase, Takehiro Noguchi, Koichi Takemura, Yoichi Miyasaka, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Variation of ferroelectric properties with temperature was investigated on SrBi_2Ta_2O_9(SBT)thin films with varying their Sr/Bi/Ta ratio. Sr20% deficient films were stable against temperature increase in terms of remanent polarization (Pr)decrease, compared to Sr non-deficient films. This is because of high Curie temperature (Tc)and relatively large coercive field of Sr deficient films. Sr deficient films were superior to Sr non-deficient films in imprint endurance at elevated temperature. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | SBT / remanent polarization / coercive field / Curie temperature / imprint |
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| Conference Information | |
| Committee | ED |
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| Conference Date | 1998/3/13(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Electron Devices (ED) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Variation of ferroelectric properties with temperature in SBT thin films |
| Sub Title (in English) | |
| Keyword(1) | SBT |
| Keyword(2) | remanent polarization |
| Keyword(3) | coercive field |
| Keyword(4) | Curie temperature |
| Keyword(5) | imprint |
| 1st Author's Name | Takashi Hase |
| 1st Author's Affiliation | Fundamental Research Laboratories, NEC Corporation() |
| 2nd Author's Name | Takehiro Noguchi |
| 2nd Author's Affiliation | Fundamental Research Laboratories, NEC Corporation |
| 3rd Author's Name | Koichi Takemura |
| 3rd Author's Affiliation | Fundamental Research Laboratories, NEC Corporation |
| 4th Author's Name | Yoichi Miyasaka |
| 4th Author's Affiliation | Fundamental Research Laboratories, NEC Corporation |
| Date | 1998/3/13 |
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| Volume (vol) | vol.97 |
| Number (no) | 603 |
| Page | pp.pp.- |
| #Pages | 7 |
| Date of Issue | |