Presentation | |
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Nobuhiko Miki(Kagawa Univ.), Yoshiyuki Watanabe(Kagawa Univ.), Satoshi Suyama(NTT DOCOMO), Satoshi Nagata(NTT DOCOMO), [Date]2018-01-22[Paper #]IT2017-67,SIP2017-75,RCS2017-281 | |
Takeo Ohgane(Hokkaido Univ.), Toshihiko Nishimura(Hokkaido Univ.), Yasutaka Ogawa(Hokkaido Univ.), [Date]2018-01-22[Paper #]IT2017-84,SIP2017-92,RCS2017-298 | |
Jumpei Yamamoto(Hokkaido Univ.), Toshihiko Nishimura(Hokkaido Univ.), Takeo Ohgane(Hokkaido Univ.), Yasutaka Ogawa(Hokkaido Univ.), Yoshihisa Kishiyama(NTT DOCOMO), Daiki Takeda(NTT DOCOMO), [Date]2018-01-22[Paper #]IT2017-76,SIP2017-84,RCS2017-290 | |
Vamoua Yachongka(Univ. of Electro-Comm.), Hideki Yagi(Univ. of Electro-Comm.), [Date]2018-01-22[Paper #]IT2017-60,SIP2017-68,RCS2017-274 | |
Nozomi Miya(Aoyama Gakuin Univ.), Takahiro Yoshida(Yokohama College of Commerce), Hajime Jinushi(Aoyama Gakuin Univ.), [Date]2018-01-22[Paper #]IT2017-61,SIP2017-69,RCS2017-275 | |
Ryuji Kurihara(Kitayu U.), Masahiro Okuda(Kitayu U.), [Date]2018-01-22[Paper #]IT2017-73,SIP2017-81,RCS2017-287 | |
Satoshi Suyama(NTT DOCOMO), Tatsuki Okuyama(NTT DOCOMO), Jun Mashino(NTT DOCOMO), Yukihiko Okumura(NTT DOCOMO), [Date]2018-01-22[Paper #]IT2017-75,SIP2017-83,RCS2017-289 | |
Hidekazu Murata(Kyoto Univ.), Yukitoshi Sanada(Keio Univ.), Eisuke Fukuda(Fujitsu Labs), Satoshi Suyama(NTT DOCOMO), Tomoya Tandai(Toshiba), Toshihiko Nishimura(Hokkaido Univ.), Tetsuya Yamamoto(Panasonic), Koichi Ishihara(NTT), Shinsuke Ibi(Osaka Univ.), Hiroshi Nishimoto(Mitsubishi Electric), [Date]2018-01-22[Paper #]IT2017-55,SIP2017-63,RCS2017-269 | |
Yukitoshi Sanada(Keio Univ.), Hidekazu Murata(Kyoto Univ.), Eisuke Fukuda(Fujitsu Labs), Satoshi Suyama(NTT DOCOMO), Tomoya Tandai(Toshiba), Toshihiko Nishimura(Hokkaido Univ.), Tetsuya Yamamoto(Panasonic), Koichi Ishihara(NTT), Shinsuke Ibi(Osaka Univ.), Hiroshi Nishimoto(Mitsubishi Electric), [Date]2018-01-22[Paper #]IT2017-56,SIP2017-64,RCS2017-270 | |
Yuya Kimura(Okayama Univ.), Satoshi Denno(Okayama Univ.), Yafei Hou(Okayama Univ.), [Date]2018-01-22[Paper #]IT2017-65,SIP2017-73,RCS2017-279 | |
Keigo Takeuchi(TUT), [Date]2018-01-23[Paper #]IT2017-97,SIP2017-105,RCS2017-311 | |
Lu Wang(Keio Univ.), Tomoaki Ohtsuki(Keio Univ.), [Date]2018-01-23[Paper #]IT2017-96,SIP2017-104,RCS2017-310 | |
Yuki Yoshioka(Univ. of Electro-Comm.), Hideki Yagi(Univ. of Electro-Comm.), [Date]2018-01-23[Paper #]IT2017-90,SIP2017-98,RCS2017-304 | |
Akinori Inaba(Univ. of Electro-Comm.), Hideki Yagi(Univ. of Electro-Comm.), [Date]2018-01-23[Paper #]IT2017-92,SIP2017-100,RCS2017-306 | |
Yuming Yang(Univ. of Electro-Comm.), Hideki Yagi(Univ. of Electro-Comm.), [Date]2018-01-23[Paper #]IT2017-91,SIP2017-99,RCS2017-305 | |
Taiki Ida(TUAT), Yuichi Tanaka(TUAT), [Date]2018-01-23[Paper #]IT2017-94,SIP2017-102,RCS2017-308 | |
Akie Sakiyama(TUAT), Yuichi Tanaka(TUAT), [Date]2018-01-23[Paper #]IT2017-95,SIP2017-103,RCS2017-309 | |
Ling Xinyue(Osaka Univ.), Shinsuke Ibi(Osaka Univ.), Kenji Miyamoto(NTT), Seiichi Sampei(Osaka Univ.), Jun Terada(NTT), Akihiro Otaka(NTT), [Date]2018-01-23[Paper #]IT2017-88,SIP2017-96,RCS2017-302 | |
Keisuke Wakao(NTT), Hirantha Abeysekera(NTT), Kenichi Kawamura(NTT), Yasushi Takatori(NTT), [Date]2018-01-23[Paper #]IT2017-101,SIP2017-109,RCS2017-315 | |
Kazuki Tsuji(Doshisha Univ.), Hideichi Sasaoka(Doshisha Univ.), Hisato Iwai(Doshisha Univ.), [Date]2018-01-23[Paper #]IT2017-85,SIP2017-93,RCS2017-299 |