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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| RECONF, VLD | 2024-01-29 10:30 |
Kanagawa | AIRBIC Meeting Room 1-4 (Primary: On-site, Secondary: Online) |
Random number generation on the Rocket core with a built-in LFSR Takayoshi Shikano, Shuichi Ichikawa (Toyohashi Tech.)  VLD2023-80 RECONF2023-83 |
Masaoka et al. developed an unpredictable random number generator (URNG) using a built-in linear feedback shift register... [more] | VLD2023-80 RECONF2023-83 pp.1-6 |
| DC | 2022-03-01 14:45 |
Tokyo | Kikai-Shinko-Kaikan Bldg. (Primary: On-site, Secondary: Online) |
SAT-based LFSR Seed Generation for Delay Fault BIST Kotaro Iwamoto, Satoshi Ohtake (Oita Univ.) DC2021-74 |
So far, a one-pass LFSR seed generation method for delay fault BIST has been proposed. The method directly generates see... [more] | DC2021-74 pp.57-62 |
| ICD, CPSY, CAS | 2017-12-14 15:10 |
Okinawa | Art Hotel Ishigakijima | Study on acceleration of Paralleled Linear Feedback Shift Register PRBS Generator Keisuke Iyama, Masaki Ishii, Masahiro Sasaki (SIT) CAS2017-85 ICD2017-73 CPSY2017-82 |
The operation speed of the on-chip test pattern generator that tests normal operation of LSI chip is determined by the p... [more] | CAS2017-85 ICD2017-73 CPSY2017-82 p.99 |
| VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2017-11-06 14:30 |
Kumamoto | Kumamoto-Kenminkouryukan Parea | A Method of LFSR Seed Generation for Improving Quality of Delay Fault BIST Kyonosuke Watanabe, Satoshi Ohtake (Oita Univ.) VLD2017-35 DC2017-41 |
With the miniaturization and high speed of large scale integrated circuits, it has become important to test delay faults... [more] | VLD2017-35 DC2017-41 pp.49-54 |
| DC | 2016-02-17 14:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Built-In Self-Test with Combination of Weighted Random Pattern and Reseeding Sayaka Satonaka, Tomokazu Yoneda, Yuta Yamato, Michiko Inoue (NAIST) DC2015-92 |
Built-In Self-Test (BIST) is widely used to reduce test cost. However, it is difficult to achieve high fault coverage wi... [more] | DC2015-92 pp.37-42 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2015-12-03 14:10 |
Nagasaki | Nagasaki Kinro Fukushi Kaikan | An approach to LFSR/MISR seed generation for delay fault BIST Daichi Shimazu, Satishi Ohtake (Oita Univ.) VLD2015-70 DC2015-66 |
In this paper, we propose a method of LFSR/MISR seed generation for delay fault BIST. A widely used conventional way to... [more] |
VLD2015-70 DC2015-66 pp.213-218 |
| RECONF | 2015-06-20 11:10 |
Kyoto | Kyoto University | A Rapid Verification Environment for Statistical Evaluation of PUF Circuits Toshihiro Katashita, Yasunori Onda, Yohei Hori (AIST) RECONF2015-18 |
In this study, we constructed a rapid experimentation environment for Physically Unclonable Function (PUF) circuit verif... [more] | RECONF2015-18 pp.97-102 |
| ICSS | 2015-03-04 09:50 |
Okinawa | Meio Univiersity | A study on the safety of the pseudo-random number generator in RFID Hiroyuki Sato (JAIST), Atsuko Miyaji (JAIST/JST CREST), Chunhua Su (JAIST) ICSS2014-75 |
One of the ways of verifing that whether pseudo-random number generator (PRNG) meets the security requirements or not is... [more] | ICSS2014-75 pp.73-78 |
| DC | 2015-02-13 15:20 |
Tokyo | Kikai-Shinko-Kaikan Bldg | A Method of LFSR Seed Generation for Hierarchical BIST Kosuke Sawaki, Satoshi Ohtake (Oita Univ.) DC2014-85 |
A linear feedback shift register (LFSR) is used as a test pattern generator of built-in self-test (BIST). In BIST, alth... [more] |
DC2014-85 pp.43-48 |
| SIP, CAS, MSS, VLD | 2013-07-12 14:10 |
Kumamoto | Kumamoto Univ. | On Auto-Correlation Properties of Random Binary Sequences with Post-Processing Based on Chaos Theory Kota Morikawa, Akio Tsuneda (Kumamoto Univ.) CAS2013-29 VLD2013-39 SIP2013-59 MSS2013-29 |
In Monte Carlo simulations, not only uncorrelated random sequences but also correlated ones are useful for simulating va... [more] | CAS2013-29 VLD2013-39 SIP2013-59 MSS2013-29 pp.159-163 |
| DC | 2013-06-21 14:15 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | A method of deterministic LFSR seed generation for scan-based BIST Takanori Moriyasu, Satoshi Ohtake (Oita Univ.) DC2013-11 |
This paper proposes a method of LFSR seed generation for LFSR reseeding of scan-based BIST of VLSI circuits. So far, a s... [more] | DC2013-11 pp.7-12 |
| RECONF | 2013-05-21 14:45 |
Kochi | Kochi Prefectural Culture Hall | Performance Evaluation of Physical Unclonable FUnctions on Kintex-7 FPGA Yohei Hori, Toshihiro Katashita, Kazukuni Kobara (AIST) RECONF2013-17 |
The challenge-response properties of Physical Unclonable Functions (PUFs) on 28-nm process FPGA on the ten SASEBO-GIII ... [more] |
RECONF2013-17 pp.91-96 |
| CAS | 2013-01-28 09:25 |
Oita | Beppu International Convention Center | Performance Evaluation of Spreading Codes with Negative Auto-Correlation Based on M-sequences and Chaos Theory Shohei Tokunaga, Akio Tsuneda (Kumamoto Univ.) CAS2012-66 |
Spreading codes with appropriate negative auto-correlation can reduce average multiple access interference (MAI) in asyn... [more] | CAS2012-66 pp.5-10 |
| CAS | 2012-01-19 14:45 |
Fukuoka | Kyushu Univ. | Evaluation of Spreading Codes with Negative Auto-Correlation Based on M-Sequences and Chaos Theory Shohei Tokunaga, Akio Tsuneda (Kumamoto Univ.) CAS2011-95 |
Spreading sequences with appropriate negative auto-correlation can reduce average multiple access interference (MAI) in ... [more] | CAS2011-95 pp.59-62 |
| CAS, NLP | 2009-01-23 10:00 |
Miyazaki | BER Performance of Spreading Sequences with Negative Auto-correlations Based on Chaos Theory and LFSR Sequences Akio Tsuneda, Yasunori Miyazaki (Kumamoto Univ.) CAS2008-87 NLP2008-117 |
In asynchronous DS/CDMA systems, spreading sequences with appropriate negative auto-correlation properties can outperfo... [more] |
CAS2008-87 NLP2008-117 pp.131-136 |
|
| NLP | 2007-11-22 16:00 |
Fukuoka | Design and Evaluation of Spreading Sequences with Negative Auto-correlations Based on Chaos Theory and LFSR Sequences Yasunori Miyazaki, Akio Tsuneda, Takahiro Inoue (Kumamoto Univ.) NLP2007-104 |
In DS/CDMA systems, spreading sequences play an important role since they dominate the system performance such as bit er... [more] | NLP2007-104 pp.51-55 |
|
| NLP | 2007-11-22 16:25 |
Fukuoka | A Study on Maximal-Period Sequences Generated by Feedback-Switching NFSR Raphael Eboku, Akio Tsuneda, Takahiro Inoue (Kumamoto Univ.) NLP2007-105 |
We propose a method to generate sequences using feedback-limited nonlinear feedback shift registers (NFSRs) with switc... [more] |
NLP2007-105 pp.57-60 |
|
| NLP | 2006-05-11 12:30 |
Kumamoto | Kumamoto Univ. | A Study on Test Pattern Generation for LSI Tests Using Chaotic Sequences Atsushi Izukura, Ryusuke Tsuchida, Kunihiko Kudou, Daisaburo Yoshioka, Akio Tsuneda, Takahiro Inoue (Kumamoto Univ.) |
Linear feedback shift registers (LFSRs) are extensively used in built-in self-test (BIST) as a test pattern generator (T... [more] | NLP2006-1 pp.1-4 |
| IT | 2005-09-27 14:45 |
Fukushima | Aizu Univ. | A consideration on maximum-likelihood decoding for Reed-Solomon codes Muneyuki Shotsu (Shinshu Univ.), Masazumi Kurihara (Univ. of Electro-Com.), Tatsuo Sugimura (Shinshu Univ.) |
In the report, the efficient method of maximum-likelihood decoding for Reed-Solomon(R-S) code is proposed. The maximum-l... [more] | IT2005-54 pp.19-24 |
| ICD, CPM | 2005-01-28 15:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Selection of Seeds and Phase Shifters for Scan BIST Masayuki Arai, Harunobu Kurokawa, Kenichi Ichino, Satoshi Fukumoto, Kazuhiko Iwasaki (Tokyo Metro. Univ.) |
In this paper, we discuss the application of a seed-selection procedure for LFSR-based BIST to multiple scan chains, com... [more] | CPM2004-171 ICD2004-216 pp.53-58 |
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