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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DC |
2022-03-01 15:45 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. (Primary: On-site, Secondary: Online) |
Evaluation of Don't Care Filling Method of Control Signals to Enhance Fault Diagnosability for Logic and Timing Fault Kohei Tsuchibuchi, Xu Haofeng, Yuya Chida, Toshinori Hosokawa (Nihon Univ), Koji Yamazaki (Meiji Univ) DC2021-76 |
[more] |
DC2021-76 pp.69-74 |
CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] |
2021-03-26 11:20 |
Online |
Online |
A Don't Care Filling Method of Control Signals for Controllers to Enhance Fault Diagnosability at Register Transfer Level Kohei Tsuchibuchi, Toshinori Hosokawa (Nihon Univ), Koji Yamazaki (Meiji Univ.) CPSY2020-62 DC2020-92 |
With the progress of semiconductor technology in recent years, fault analysis is important to improve the yield of VLSIs... [more] |
CPSY2020-62 DC2020-92 pp.73-78 |
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