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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| DC | 2024-02-28 15:05 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Locating High Power Consuming Area by Branch and Reconvergence Topology Analysis for Logic Circuit Tomoya Yamashita, Kohei Miyase, Xiaoqing Wen (Kyutech)  DC2023-101 |
In recent years, there has been remarkable progress in the manufacturing technology of LSIs (Large Scale Integration). D... [more] | DC2023-101 pp.41-46 |
| DC | 2022-03-01 14:20 |
Tokyo | Kikai-Shinko-Kaikan Bldg. (Primary: On-site, Secondary: Online) |
Evaluation of Efficiency for a Method to Locate High Power Consumption with Switching Provability Ryu Hoshino, Taiki Utsunomiya, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara (Kyutech) DC2021-73 |
In recent years, as the high speed and miniaturization of LSIs have improved, it has become more difficult to test LSIs．... [more] | DC2021-73 pp.51-56 |
| VLD, DC, RECONF, ICD, IPSJ-SLDM (Joint) [detail] |
2020-11-17 10:30 |
Online | Online | Power Analysis Based on Probability Calculation of Small Regions in LSI Ryo Oba, Ryu Hoshino, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara (Kyutech) VLD2020-13 ICD2020-33 DC2020-33 RECONF2020-32 |
Power consumption in LSI testing is higher than in functional mode since more switching activities occur. High power con... [more] | VLD2020-13 ICD2020-33 DC2020-33 RECONF2020-32 pp.12-17 |
| DC | 2020-02-26 14:35 |
Tokyo | Power Analysis for Logic Area of LSI Including Memory Area Yuya Kodama, Kohei Miyase, Daiki Takafuji, Xiaoqing Wen, Seiji Kajihara (Kyutech) DC2019-93 |
Power consumption during LSI testing is higher than functional mode. Excessive IR-drop causes excessive delay, resulting... [more] | DC2019-93 pp.43-48 |
|
| EMCJ, IEE-EMC, IEE-MAG | 2018-11-22 15:10 |
Overseas | KAIST | [Poster Presentation]
An Electromagnetic Field Reduction Method for Inductive Power Transfer in Transportation System Jedok Kim, Seungyoung Ahn (KAIST) EMCJ2018-75 |
Currently, charging electric transportation systems with wireless power transfer (WPT) technologies are drawing strong a... [more] | EMCJ2018-75 p.53 |
| DC | 2018-02-20 11:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Locating Hot Spots with Justification Techniques in a Layout Design Yudai Kawano, Kohei Miyase, Seiji Kajihara, Xiaoqing Wen (Kyutech) DC2017-80 |
In general, power consumption during LSI testing is higher than functional operation. Excessive power consumption in at-... [more] | DC2017-80 pp.19-24 |
| DC | 2015-06-16 15:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | A Method to Identify High Test Power Areas in Layout Design Kohei Miyase (Kyutech), Matthias Sauer, Bernd Becker (Univ. Freiburg), Xiaoqing Wen, Seiji Kajihara (Kyutech) DC2015-18 |
The problems related to power consumption during at-speed testing is becoming more serious. Particularly, excessive peak... [more] | DC2015-18 pp.13-18 |
| SS | 2013-01-11 11:45 |
Okinawa | An Energy Profiler for Android Applications Used in the Real World Hiroki Furusho, Kenji Hisazumi (Kyushu Univ.), Takeshi Kamiyama, Hiroshi Inamura (NTT DOCOMO), Tsuneo Nakanishi, Akira Fukuda (Kyushu Univ.) |
This paper proposes a method for collecting essential data for profiling energy consumption of applications that run on ... [more] | SS2012-58 pp.73-78 |
|
| SANE | 2012-04-26 13:00 |
Nagano | Usuda Deep Space Center, JAXA | "AMATELUS" a laser utilized satellite designed for achieving on-orbit solar energy transmission toward manned Luna base. Seiichiro Arakawa, Yuto Takei, Yuki Katada, Masahiro Kawaguchi (Tokyo Tech) SANE2012-1 |
For its rich natural resources and attractive environment for scientific research, equatorial region of the Moon is one ... [more] | SANE2012-1 pp.1-6 |
| DC | 2011-02-14 11:50 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | A Pattern Generation Method to Uniform Initial Temperature of Test Application Emiko Kosoegawa, Tomokazu Yoneda, Michiko Inoue, Hideo Fujiwara (NAIST/JST) DC2010-63 |
Circuit failure prediction is essential to ensure product quality and in-field reliability. The basic principle of circu... [more] | DC2010-63 pp.27-32 |
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