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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| DC | 2023-02-28 16:15 |
Tokyo | Kikai-Shinko-Kaikan Bldg (Primary: On-site, Secondary: Online) |
A Novel High Performance Scan-Test-Aware Hardened Latch with Improved Soft Error Tolerability Ruijun Ma (AUST), Stefan Holst, Xiaoqing Wen (KIT), Hui Xu (AUST), Aibin Yan (AU)  DC2022-91 |
The continuous pursuing of smaller technology nodes makes modern Integrated Circuits (ICs) more and more susceptible to ... [more] | DC2022-91 pp.51-55 |
| AP (2nd) |
2022-12-08 14:05 |
Okinawa | (Primary: On-site, Secondary: Online) |
Experimental evaluation of the gain of antenna-integrated radio unit for base station of mobile communication systems using spherical scanning method Yuki Inoue, Masashi Yamamoto (NTT DOCOMO) |
New Radio (NR) which is the specification of 5th generation mobile communication system (5G), adds a new base station co... [more] | |
| VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] | 2022-11-30 15:10 |
Kumamoto | (Primary: On-site, Secondary: Online) |
FPGA Implementation and Area Evaluation of JTAG Access Mechanism Using Lightweight One-Time Password Authentication Scheme Hisashi Okamoto, Jun Ma, Senling Wang, Hiroshi Kai, Hiroshi Takahashi (Ehime Univ), Akihiro Shimizu (Kochi Univ. of Technology) VLD2022-48 ICD2022-65 DC2022-64 RECONF2022-71 |
When building a cyber-physical system (CPS), it is essential to guarantee the fault tolerance and security of edge devic... [more] | VLD2022-48 ICD2022-65 DC2022-64 RECONF2022-71 pp.168-173 |
| DC | 2022-03-01 14:45 |
Tokyo | Kikai-Shinko-Kaikan Bldg. (Primary: On-site, Secondary: Online) |
SAT-based LFSR Seed Generation for Delay Fault BIST Kotaro Iwamoto, Satoshi Ohtake (Oita Univ.) DC2021-74 |
So far, a one-pass LFSR seed generation method for delay fault BIST has been proposed. The method directly generates see... [more] | DC2021-74 pp.57-62 |
| US | 2021-06-18 14:30 |
Online | Online | Construction of discrimination support system using GAN for non-destructive testing images by scanning elastic wave source technique Kyosuke Shimizu, Ayumu Osumi, Youichi Ito (Nihon Univ.) US2021-11 |
We proposed Scanning Airborne Ultrasound Source Technique (SAUA). SAUS is a detecting method of thinning defects generat... [more] | US2021-11 pp.18-22 |
| US | 2021-05-17 14:50 |
Online | Online | Visualization of guided wave propagation using scanning nonlinear elastic wave source technique with airborne ultrasound phased array Kyosuke Shimizu, Ayumu Osumi, Youichi Ito (Nihon Univ.) US2021-3 |
We aim to realize a scanning laser source technique (SLS) by using high-intensity airborne ultrasonic waves. As one of ... [more] |
US2021-3 pp.12-15 |
| SANE | 2021-05-13 11:30 |
Online | Online | [Invited Talk]
RCS Evaluation by Electromagnetic Near-field to Far-field Transformation Hirokazu Kobayashi (EM System Lab) SANE2021-4 |
In this paper, we discuss the near-field to far-field transformation (NFFFT) theory for radar cross-section (RCS) of an ... [more] | SANE2021-4 pp.15-26 |
| EA, US, SP, SIP, IPSJ-SLP [detail] | 2021-03-03 14:05 |
Online | Online | [Poster Presentation]
Experimental evaluation of non-contact ultrasonic thickness gauging method using spatial frequency filter for inclined steel plate Shun Uemae (KU), Kazuki Abukawa, (NITKC), Tomoo Satoh, Sayuri Matsumoto (PARI), Kotaro Hoshiba, Takenobu Tsuchiya, Nobuyuki Endoh (KU) US2020-80 |
Thickness gauging of steel sheet piles used in port facilities is necessary to inspect performance deterioration due to ... [more] | US2020-80 pp.18-23 |
| US | 2021-02-22 13:50 |
Online | Online | Investigation of ultrasound emitter diameter and suppression of grating lobe of an airborne ultrasound phased array Kyosuke Shimizu, Ayumu Osumi, Youichi Ito (Nihon Univ.) US2020-68 |
There is a scanning laser source technique (SLS) for performing high-speed measurement by scanning a laser excitation s... [more] |
US2020-68 pp.10-13 |
| DC | 2021-02-05 11:35 |
Online | Online | A Novel High Performance Scan-Test-Aware Hardened Latch Design Ruijun Ma, Stefan Holst, Xiaoqing Wen (KIT), Aibin Yan (AHU), Hui Xu (AUST) DC2020-71 |
As modern technology nodes become more and more susceptible to soft-errors, many radiation hardened latch designs have b... [more] | DC2020-71 pp.12-17 |
| DC | 2021-02-05 15:30 |
Online | Online | A Don't Care Filling Method of Control Signals Based on Non-scan Field Testability at Register Transfer Level Yuki Ikegaya, Yuta Ishiyama, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.) DC2020-77 |
A field testing that monitors the values of circuit outputs and internal signal lines during function mode is used as on... [more] | DC2020-77 pp.48-53 |
| EA, EMM | 2019-11-22 14:00 |
Ishikawa | Kanazawa Institute of Technology | [Poster Presentation]
Experiment-at-sea for automatic detection of underwater targets by applying the Hough transform to the fan beam output image of side scan sonar Takaya Ooe, Suguru Kuriyama, Kazuhiko Ohta (KIT) EA2019-53 EMM2019-81 |
By transmitting a fan beam with a narrow directivity width formed by a side-scan sonar in the horizontal direction, det... [more] |
EA2019-53 EMM2019-81 pp.9-10 |
| VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2019-11-14 15:20 |
Ehime | Ehime Prefecture Gender Equality Center | A Generation Method of Easily Testable Functional k Time Expansion Model for a Transition Fault Model Using Controller Augmentation and Partial Scan Designs Yuta Ishiyama, Toshinori Hosokawa, Yuki Ikegaya (Nihon Univ.) VLD2019-43 DC2019-67 |
One of the challenges on VLSI testing is to reduce the area overhead and test application time of design-for-testability... [more] | VLD2019-43 DC2019-67 pp.133-138 |
| DC, SS | 2019-10-24 16:00 |
Kumamoto | Kumamoto Univ. | A Non-scan Online Test Based on Covering n-Time State Transition Yuki Ikegaya, Yuta Ishiyama, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.) SS2019-19 DC2019-47 |
As one of the means to avoid the fault due to the deteriorate over time of VLSI, online test is used to monitor the outp... [more] | SS2019-19 DC2019-47 pp.37-42 |
| VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2018-12-06 13:00 |
Hiroshima | Satellite Campus Hiroshima | Test Time Reduction by Separating Delay Lines in Boundary Scan Circuit with Embedded TDC Satoshi Hirai, Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.) VLD2018-56 DC2018-42 |
3D die-stacking technique using TSVs has gained much attention as a new integration method of IC. However, faulty TSVs ... [more] |
VLD2018-56 DC2018-42 pp.119-124 |
| VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2018-12-06 13:25 |
Hiroshima | Satellite Campus Hiroshima | Evaluation of Flexible Test Power Control for Logic BIST in TEG Chips Takaaki Kato (KIT), Senling Wang (Ehime Univ.), Yasuo Sato, Seiji Kajihara (KIT) VLD2018-57 DC2018-43 |
Scan-based logic BIST has a crucial problem of high test power dissipation. Its solution requires a flexible test power ... [more] | VLD2018-57 DC2018-43 pp.125-130 |
| PRMU, MI, IE, SIP | 2018-05-18 15:15 |
Gifu | A Study on Mode-Size Dependent Coefficient Scanning for Future Video Coding Yoshitaka Kidani, Kei Kawamura, Sei Naito (KDDI Research) SIP2018-16 IE2018-16 PRMU2018-16 MI2018-16 |
Mode dependent coefficient scan (MDCS) was introduced to HEVC that identifies a coefficient scan order in transformed re... [more] | SIP2018-16 IE2018-16 PRMU2018-16 MI2018-16 pp.69-74 |
|
| DC | 2018-02-20 10:35 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Reduction of Wire Length by Reordering Delay Elements in Boundary Scan Circuit with Embedded TDC Satoshi Hirai, Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.) DC2017-79 |
TSV attracts attention as a new implementation method of interconnects between dies in 3DICs. However, faulty TSVs may ... [more] |
DC2017-79 pp.13-18 |
| SANE | 2018-01-26 16:05 |
Nagasaki | Nagasaki Prefectural Art Museum | RCS Near-field to Far-field Transformation
-- Theory and Application -- Hirokazu Kobayashi (OIT), Andrey Osipov (DLR), Chihyuan Chu (NTUT) SANE2017-108 |
In recent years, it is profoundly demanded to measure radar cross-section (RCS) for electrically large objects. When the... [more] | SANE2017-108 pp.129-134 |
| MRIS, ITE-MMS | 2017-12-07 15:20 |
Ehime | Ehime Univ. | Demonstration of High Speed Reading in Ferroelectric Data Storage Using Pb(Zr,Ti)O3 Recording Medium Reshan Maduka Abeysinghe, Yoshiomi Hiranaga, Yasuo Cho (RIEC, Tohoku Univ.) MR2017-31 |
High-speed readout tests were conducted using a hard disk drive (HDD) type ferroelectric data storage test system based ... [more] | MR2017-31 pp.29-34 |
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