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 Results 21 - 24 of 24 [Previous]  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
LQE 2009-12-11
11:25		 Tokyo Kikai-Shinko-Kaikan Bldg. Analysis of Stable Behavior in InAs/InP MQW DFB laser Using an OBIC Monitor
Tatsuya Takeshita, Tomonari Sato, Manabu Mitsuhara, Yasuhiro Kondo, Hiromi Oohashi (NTT Corp.) LQE2009-143		 We have realized reliable 2.3 $\micron$m wavelength InAs/InP MQW DFB lasers for trace gas monitoring applications. The e... [more] LQE2009-143
pp.25-30
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2009-12-04
14:25		 Kochi Kochi City Culture-Plaza A Path Selection Method of Delay Test for Transistor Aging
Mitsumasa Noda (Kyushu Institute of Tech.), Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen (Kyushu Institute of Tech./JST), Yukiya Miura (Tokyo Metropolitan Univ./JST) VLD2009-65 DC2009-52		 With the advanced VLSI process technology, it is important for reliability of VLSIs to deal with faults caused by aging.... [more] VLD2009-65 DC2009-52
pp.167-172
OPE, CPM, R 2008-04-18
14:05		 Tokyo Kikai-Shinko-Kaikan Bldg. Analysis of Wear-Out Degradation of a Ru-doped SIBH InGaAsP DFB laser Using an Optical-Beam-Induced Current Monitor
Tatsuya Takeshita, Ryuzo Iga, Mitsuru Sugo, Yasuhiro Kondo (NTT) R2008-3 CPM2008-3 OPE2008-3		 We investigated the degradation behavior of InGaAsP distributed feedback lasers (DFBs) at high temperature by employing ... [more] R2008-3 CPM2008-3 OPE2008-3
pp.11-16
OPE, LQE, OCS 2006-10-13
15:20		 Fukuoka Kyusyu Univ. Chikushi Campus Highly reliable 1.5-μm DFB laser with SIBH structure
Tatsuya Takeshita, Takashi Tadokoro, Ryuzo Iga, Yuichi Tohmori (NTT), Mitsuo Yamamoto (NEL), Mitsuru Sugo (NTT) OCS2006-58 OPE2006-111 LQE2006-100		 We have achieved a DFB laser with high reliability (<1000FITs) at 95°C that is capable of error-free 2.5 Gbps 80 km tran... [more] OCS2006-58 OPE2006-111 LQE2006-100
pp.91-95
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