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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
QIT (2nd) |
2019-05-20 13:20 |
Fukuoka |
Kyushu University, Chikushi Campus |
[Poster Presentation]
Reduction of size and excess noise of continuous-variable quantum key distribution system using single-path interferometer Shinya Hirashita, Kento Kitamura, Takuya Hirano (Gakushuin Univ.) |
It is necessary to reduce excess noise in order to realize continuous quantum key distribution (CV- QKD) in a channel wi... [more] |
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OFT, OPE |
2009-03-06 14:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg |
Highly accurate measurement of the InAlAs-APD excess noise. Jun Ishihara (Rits Univ.), Takeshi Nakata (NEC Corp. Nano Electronics Labs), Kenichi Kasahara (Rits Univ.), Kikuo Makita (NEC Corp. Nano Electronics Labs) OFT2008-95 OPE2008-195 |
The excess noise and ionization coefficient ratio of InAlAs avalanche photodiodes (APDs) for Gbps optical fiber communic... [more] |
OFT2008-95 OPE2008-195 pp.45-50 |
LQE, CPM, EMD, OPE |
2008-08-29 10:55 |
Miyagi |
Touhoku Univ. |
The guardring-free InAlAs Avalanche Photodiodes for optical communication Masaharu Nakaji, Eitaro Ishimura, Eiji Yagyu, Yohei Mikami, Susumu Ihara, Toshitaka Aoyagi, Kiichi Yoshiara, Takahide Ishikawa (Mitsubishi electric corp.) EMD2008-49 CPM2008-64 OPE2008-79 LQE2008-48 |
We present a guardring-free InAlAs APD, which achieves low noise and high reliability. The InAlAs APDs produced sensitiv... [more] |
EMD2008-49 CPM2008-64 OPE2008-79 LQE2008-48 pp.89-92 |
OCS |
2005-06-17 10:05 |
Yamanashi |
Univ. of Yamanashi |
Noise figure of parametric wavelength conversion Etsushi Yamazaki, Atsushi Takada, Toshio Morioka (NTT) |
An analytical model for noise accumulation in parametric wavelength conversion chain system is proposed. Signal to nois... [more] |
OCS2005-27 pp.7-12 |
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